Investigation of phase formation of Bi2Sr2CaCu2O8+X under oxygen-free conditions and its application in resistance switching

被引:0
作者
Jia, Jiqiang [1 ]
Zhang, Tao [1 ]
Lei, Li [1 ]
机构
[1] Xian Univ Technol, Adv Mat Anal & Test Ctr, 5 Jinhua South Rd, Xian 710048, Shaanxi, Peoples R China
关键词
Pulsed laser deposition; Crystal growth; Superconductivity; Resistive switching effect; Current transport characteristics; TRANSPORT-PROPERTIES; WORK FUNCTION; TEMPERATURE; BEHAVIOR; AG;
D O I
10.1016/j.mssp.2025.109378
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper investigates the growth process of Bi2Sr2CaCu2O8+X (Bi-2212) films using the pulsed laser deposition method in both oxygen and oxygen-free (nitrogen) conditions. Furthermore, the resistance switching (RS) effect of Bi-2212/Nb: SrTiO3 (NSTO) structure is explored. Bi-2212 films are deposited in oxygen and nitrogen atmospheres respectively, and the effects of laser energy, deposition temperature, atmospheric pressure, and oxygen diffusion process on phase formation and superconductivity are thoroughly studied. The high-quality Bi2212 phase can be obtained at a deposition temperature of 800 degrees C, laser energy of 250 mJ, and an oxygen or nitrogen pressure of 65 Pa. The low-temperature diffusion process further enhances the superconducting properties, with oxygen-diffused samples exhibiting critical transition temperatures of approximately 83 K (deposition in oxygen) and 74 K (deposition in nitrogen). Additionally, the RS effect of Bi-2212/NSTO structures is investigated, where Bi-2212 is used as both the electrode and the hetero-layer for NSTO. Oxygen vacancies inherently present in Bi-2212 migrate to the Bi-2212/NSTO interface under low voltage, increasing the interfacial barrier. However, as the bias voltage progressively increases, oxygen ions in NSTO migrate into Bi-2212, resulting in the formation of Vo on the NSTO side, thereby reducing the interfacial barrier height. As a result, the Bi-2212/NSTO structure exhibits two different RS characteristics under different voltages. These results provide experimental references for the application of Bi-2212 in oxidizable substrates, circuits, and RS effect devices.
引用
收藏
页数:12
相关论文
共 41 条
[1]   Bipolar resistive switching behavior of bilayer β-Ga2O3/WO3 thin film memristor device [J].
Alam, Mir Waqas ;
Jamir, Ayangla ;
Longkumer, Bendangchila ;
Souayeh, Basma ;
Sadaf, Shima ;
Moirangthem, Borish .
JOURNAL OF ALLOYS AND COMPOUNDS, 2025, 1010
[2]   Resistive switching behavior of LaNiO3/Nb:SrTiO3 and LaNiO3/ZrO2/Nb: SrTiO3 structures [J].
Bian, Weibai ;
Zhang, Ruixuan ;
Chen, Xiaohui ;
Jia, Jiqiang .
MATERIALS TODAY COMMUNICATIONS, 2024, 40
[3]   Defect and electrical transport properties of Nb-doped SrTiO3 [J].
Blennow, Peter ;
Hagen, Anke ;
Hansen, Kent K. ;
Wallenberg, L. Reine ;
Mogensen, Mogens .
SOLID STATE IONICS, 2008, 179 (35-36) :2047-2058
[4]   Resistive switching suppression in metal/Nb:SrTiO3 Schottky contacts prepared by room-temperature pulsed laser deposition [J].
Buzio, R. ;
Gerbi, A. .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2024, 57 (39)
[5]   Controllable analog-to-digital bipolar resistive switching behavior and mechanism analysis in 8-MnO2-based memristor [J].
Cao, Zelin ;
Sun, Bai ;
Mao, Shuangsuo ;
Zhou, Guangdong ;
Duan, Xuegang ;
Yan, Wentao ;
Sun, Siyu ;
Chen, Xiaoliang ;
Shao, Jinyou .
MATERIALS TODAY PHYSICS, 2023, 38
[6]   Backward-Like Rectifying Behavior of La1.85Sr0.15CuO4/Nb:SrTiO3 Heterojunctions [J].
Chen, L. M. ;
Xu, B. ;
Chen, Z. P. ;
Chen, P. ;
Zhang, R. .
JOURNAL OF SUPERCONDUCTIVITY AND NOVEL MAGNETISM, 2012, 25 (04) :983-988
[7]   High energy storage efficiency and temperature stability realized in the Ba0.3Sr0.7Zr0.18Ti0.82O3/LaNiO3 heterostructure thin films directly deposited on the conductive Si substrate [J].
Chen, Xiaoyang ;
Liu, Yun ;
Huang, Binbin ;
Yu, Ping .
APPLIED PHYSICS LETTERS, 2022, 121 (12)
[8]   Electrically-Driven Oxygen Vacancy Aggregation and Displacement in YBa2Cu3O7-δ Films [J].
Collienne, Simon ;
Marinkovic, Stefan ;
Fernandez-Rodriguez, Alejandro ;
Mestres, Narcis ;
Palau, Anna ;
Silhanek, Alejandro V. .
ADVANCED ELECTRONIC MATERIALS, 2022, 8 (09)
[9]   Anomalous Resistance Hysteresis in Oxide ReRAM: Oxygen Evolution and Reincorporation Revealed by In Situ TEM [J].
Cooper, David ;
Baeumer, Christoph ;
Bernier, Nicolas ;
Marchewka, Astrid ;
La Torre, Camilla ;
Dunin-Borkowski, Rafal E. ;
Menzel, Stephan ;
Waser, Rainer ;
Dittmann, Regina .
ADVANCED MATERIALS, 2017, 29 (23)
[10]   Integrated, Portable, Tunable, and Coherent Terahertz Sources and Sensitive Detectors Based on Layered Superconductors [J].
Delfanazari, Kaveh ;
Klemm, Richard A. ;
Joyce, Hannah J. ;
Ritchie, David A. ;
Kadowaki, Kazuo .
PROCEEDINGS OF THE IEEE, 2020, 108 (05) :721-734