Electron and positron impact ionization cross sections of SiF4

被引:0
作者
Song, Yunliang [1 ]
Ma, Yuwei [1 ]
Li, Bowen [1 ]
Chen, Ximeng [1 ]
机构
[1] Lanzhou Univ, Sch Nucl Sci & Technol, Lanzhou 730000, Peoples R China
基金
中国国家自然科学基金;
关键词
binary encounter bethe (BEB); fragmentation pattern; cross section; SINGLE IONIZATION; MODEL; DISSOCIATION; NE; AR; HE; CO;
D O I
10.1088/1402-4896/ada9ba
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Based on the Binary-Encounter-Bethe (BEB) model, we present comprehensive cross-sectional data on total ionization cross sections, partial cross sections, single differential cross sections, average secondary electron energy and stopping cross sections for the SiF4 molecule in the case of electron and positron impact. For the partial cross sections, we employ the mass spectrum data (MSD) method and Huber's model. By comparing theoretical calculations with experimental measurements, we determine the fragmentation pattern of SiF4. For positron scattering, we utilize three methods known as BEB0, BEBA, and BEBW. There is limited data of electron impact available on SiF4, and there is a notable lack of relevant investigations regarding positron impact with SiF4. Our research continues the exploration of electron and positron impact cross sections for SiF4 and serves as a reference for future studies.
引用
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页数:12
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