Total Reflection X-ray Fluorescence Spectrometry: A Comprehensive Review of Critical Components, Analytical Benefits and Practical Applications

Total reflection X-ray fluorescence spectrometry (TXRF) is a pivotal technique in modern atomic spectroscopy, distinguished by its capability for multi-element simultaneous determination, a wide dynamic concentration range, samples do not require acid digestion. Additionally, TXRF exhibits negligible matrix effects when samples are prepared as thin films. Based on these unique features, recent research efforts have increasingly employed laboratory-built TXRF systems for the determination of major and trace elements in various samples. Given the diverse and intricate nature of TXRF systems components, this paper provides an overview of critical components that constitute these systems, compares the influence of various parameters on analytical performance, and offers recommendations for component selection. Additionally, recent applications of laboratory-built TXRF in fields such as environmental monitoring, nuclear energy, and food safety are discussed, with a focus on sample preparation, analyzed elements, and quantitative analysis are presented together with analytical parameters such as detection limits and recoveries. By introducing the instrument components and their practical applications, this paper aims to guide researchers in the construction and optimization of TXRF systems, thereby promoting the advancement of TXRF in future research and practical applications.