Luminescence-Based Implied Voltage Imaging of Tandem Solar Cells Using Bandpass Filters

被引:0
|
作者
Zandi, Soma [1 ]
Nie, Shuai [1 ]
Zhu, Yan [1 ]
Allen, Thomas G. [2 ]
Aydin, Erkan [2 ,6 ]
Ugur, Esma [2 ]
Zheng, Jianghui [3 ,4 ,5 ]
Wang, Guoliang [3 ,4 ]
Liu, Xu [1 ]
Hao, Xiaojing [1 ]
Ho-Baillie, Anita [3 ,4 ,5 ]
De Wolf, Stefaan [2 ]
Trupke, Thorsten [1 ]
Hameiri, Ziv [1 ]
机构
[1] Univ New South Wales, Sydney, NSW 2052, Australia
[2] King Abdullah Univ Sci & Technol KAUST, KAUST Solar Ctr KSC, Mat Sci & Engn Program MSE, Phys Sci & Engn Div PSE, Thuwal 239556900, Saudi Arabia
[3] Univ Sydney, Sch Phys, Sydney, NSW 2006, Australia
[4] Univ Sydney, Sydney Nano, Sydney, NSW 2006, Australia
[5] Univ New South Wales, Australian Ctr Adv Photovolta ACAP, Sydney, NSW 2052, Australia
[6] Ludwig Maximilians Univ Munchen LMU, Dept Chem, D-81377 Munich, Germany
来源
SMALL METHODS | 2025年
基金
澳大利亚研究理事会;
关键词
electroluminescence; open-circuit voltage; perovskite; photoluminescence; silicon; tandem; tandem solar cells; PHOTOLUMINESCENCE; EFFICIENCY;
D O I
10.1002/smtd.202401003
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A luminescence-based technique is demonstrated for selectively imaging the implied voltages of tandem solar cells. The luminescence emission is captured using a narrow bandpass filter so that the detected luminescence signal is insensitive to the optical properties of the device, thus, revealing the variations in the implied voltages. The proposed method is validated through simulation and experiments conducted on two-terminal perovskite/silicon tandem solar cells with different structures, optical properties, and compositions (e.g., different bandgaps for the perovskite cells). Implied voltage images of each sub-cell can be determined with a maximum relative error of 1%. The proposed technique can also be used to obtain local current-voltage curves. The method is expected to be a valuable tool for optimizing the performance of tandem solar cells, scaling up tandem devices, investigating local defects, and predicting the ultimate device performance.
引用
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页数:12
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