Surface morphology, electronic defects and passivation strategies at the p-n junction of Cu(In,Ga)(S,Se)2 solar cells

被引:0
|
作者
Elizabeth, Amala [1 ,2 ]
May, Andreas [1 ,2 ]
Volkamer, Finnegan [1 ,2 ]
Giesl, Florian [3 ]
Elanzeery, Hossam [3 ]
Dalibor, Thomas [3 ]
Abou-Ras, Daniel [4 ]
Moenig, Harry [1 ,2 ]
机构
[1] Univ Munster, Phys Inst, Wilhelm Klemm Str 10, D-48149 Munster, Germany
[2] Ctr Nanotechnol CeNTech, Heisenbergstr 11, D-48149 Munster, Germany
[3] AVANCIS GmbH, Otto Hahn Ring 6, D-81739 Munich, Germany
[4] Helmholtz Zentrum Berlin Mat & Energie GmbH, Hahn Meitner Pl 1, D-14109 Berlin, Germany
来源
JOURNAL OF PHYSICS-ENERGY | 2025年 / 7卷 / 02期
关键词
chalcopyrite solar cells; defect physics; surface analysis; sulfur; scanning tunneling spectroscopy; LEVEL DENSITY; CU DEPLETION; CU(IN; GA)SE-2; FILMS;
D O I
10.1088/2515-7655/adb90b
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Based on the high power conversion efficiencies and compatibility toward large-area deposition techniques, Cu(In,Ga)(S,Se)2 (CIGSSe) phototvoltaic absorbers are currently at the forefront of chalcopyrite thin-film solar cell technology. The performance of these solar cells is critically dependent on the properties of the interface between the p-type chalcopyrite absorber and the n-type buffer and window layers. Due to the complex defect physics of the chalcopyrites in general, the defect-electronic properties of the absorber surface is of particular concern. In this regard, the CIGSSe surfaces are considerably less understood compared with their S-free counterparts (e.g. Cu(In,Ga)Se2). In the present work, by applying high-resolution scanning probe techniques such as atomic force microscopy and scanning tunneling spectroscopy (STS), combined with electron backscatter diffraction, the morphology, the crystallographic orientation, and the defect electronic properties of CIGSSe thin-film surfaces were investigated. Our work highlights distinct differences as well as similarities between S-containing and S-free chalcopyrite thin films. Three types of features were found on the CIGSSe surface, which were found to be exclusively made of polar facets. This is different from S-free absorbers that are known to facet in both, polar and non-polar planes with distinct electronic properties. Defect density mapping using STS revealed a highly defective surface with significant lateral inhomogeneities. Furthermore, grain boundary band bending detected in S-free absorber surfaces was absent. However, similar to S-free absorbers, annealing under ultra-high vacuum conditions was found to electronically passivate the CIGSSe surface. Our results shed light on the fundamental properties of these S-containing chalcopyrite-type surfaces and demonstrate a valuable platform for further optimization of this promising solar cell technology.
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页数:12
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