Comparative Study of Data Reduction Methods in Electrical Impedance Tomography For Hand Sign Recognition

被引:1
作者
Ghoul, Bilel [1 ,2 ]
Ben Atitallah, Bilel [1 ]
Sahnoun, Salwa [2 ]
Fakhfakh, Ahmed [2 ]
Kanoun, Olfa [1 ]
机构
[1] Tech Univ Chemnitz, Fac Elect Engn & Informat Technol, Measurement & Sensor Technol, D-09126 Chemnitz, Germany
[2] Natl Sch Elect & Telecommun Sfax, Digital Res Ctr Sfax, Lab Signals Syst Artificial Intelligence & Networ, Technopole Sfax, Ons City 3021, Tunisia
来源
2024 IEEE 7TH INTERNATIONAL CONFERENCE ON ADVANCED TECHNOLOGIES, SIGNAL AND IMAGE PROCESSING, ATSIP 2024 | 2024年
关键词
Electrical Impedance Tomography; EIT; Hand Sign Recognition; HSR; Support Vector Machine; SVM; EIT data reduction;
D O I
10.1109/ATSIP62566.2024.10639011
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
Several studies have shown that electrical impedance tomography (EIT) on the human forearm can be used to classify hand signs without the need for cameras or gloves. However, the amount of measured data is in relatively high, leading to long execution times and high processing complexity. In this study, we investigate the influence of reducing the number of EIT measurements on the classification accuracy. Four different algorithms were used to halve the number of measurements, namely Principal Component Analysis (PCA), Chi-square tests, Minimum Redundancy Maximum Relevance (MRMR) and Laplacian scores. These algorithms were applied to a dataset of forearm EIT measurements corresponding to the practice of American Sign Language (ASL) in a healthy subject. The results show a slight drop in accuracy when using the quadratic support vector machine (SVM) classifier, with accuracy dropping from 95.3% to 93.4% in the best cases. A method based on a genetic algorithm (GA) was also used. This approach exploits the strengths of genetic algorithms in exploring a large solution space and converging on the near-optimal combination. This approach resulted in an increase in accuracy to 96.7%. The study demonstrated that the number of EIT measurements can be reduced without compromising overall accuracy.
引用
收藏
页码:654 / 658
页数:5
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