Reducing Wire Crossings in Field-Coupled Nanotechnologies

被引:0
|
作者
Hien, Benjamin [1 ]
Walter, Marcel [1 ,2 ]
Wille, Robert [1 ,3 ]
机构
[1] Tech Univ Munich, Chair Design Automat, Munich, Germany
[2] Univ Bremen, Bremen, Germany
[3] Software Competence Ctr Hagenberg GmbH SCCH, Hagenberg, Austria
来源
2024 IEEE 24TH INTERNATIONAL CONFERENCE ON NANOTECHNOLOGY, NANO 2024 | 2024年
关键词
D O I
10.1109/NANO61778.2024.10628717
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In the realm of circuit design, emerging technologies such as Field-Coupled Nanotechnologies (FCN) provide unique opportunities compared to conventional transistor-based logic. However, FCN also introduces a critical concern: the substantial impact of wire crossings on circuit robustness. These crossings are either unrealizable or can severely degrade signal integrity, posing significant obstacles to efficient circuit design. To address this challenge, we propose a novel approach focused on reducing wire crossings in FCN circuits. Our methodology introduces a combination of LUT mapping and decomposition aimed at producing advantageous network structures during logic synthesis to minimize wire crossings. This new optimization metric is prioritized over node count and critical path length to effectively tackle this challenge. Through empirical evaluations, we demonstrate the effectiveness of the proposed approach in reducing a first approximation for wire crossings by 41.69%. This research significantly contributes to advancing wire crossing optimization strategies in emerging circuit technologies, paving the way for more reliable and efficient designs in the post-CMOS logic era.
引用
收藏
页码:155 / 160
页数:6
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