Phase-shifting projected fringe profilometry for 3D shape measurements of dynamic objects

被引：0

作者：

Su, Wei-Hung ^{[1
]}

Li, Pei-Chi ^{[1
]}

Yu, Yeh-Wei ^{[2
]}

机构：

[1] Natl Sun Yat Sen Univ, Dept Mat Sci & Optoelect Engn, Kaohsiung 804, Taiwan

[2] Natl Cent Univ, Dept Opt & Photon, Chungli 32001, Taiwan

来源：

PHOTONIC FIBER AND CRYSTAL DEVICES: ADVANCES IN MATERIALS AND INNOVATIONS IN DEVICE APPLICATIONS XVIII | 2024年 / 13140卷

关键词：

one-shot measurements; fringe analysis; fringe projection; phase-shifting; optical inspection; DESIGN;

D O I：

10.1117/12.3029001

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A one-shot projection scheme using the phase-shifting technique to describe the profile of the dynamic object is presented. A color-encoded pattern is employed to perform the one-shot measurement. With the proposed scheme of calibration, errors caused by cross-talk between the color channels can be reduced.

引用

页数：5

共 6 条

[1] DESIGN AND ASSESSMENT OF SYMMETRICAL PHASE-SHIFTING ALGORITHMS [J].