Event-driven readout development: testing of the EDWARD65P1 chip with integrated event generators

被引：0

作者：

Gorni, D. S. ^{[1
]}

Deptuch, G. W. ^{[1
]}

Maj, P. ^{[1
]}

Mandal, S. ^{[1
]}

Pinaroli, G. ^{[1
]}

机构：

[1] Brookhaven Natl Lab, Instrumentat Dept, Upton, NY 11973 USA

来源：

JOURNAL OF INSTRUMENTATION | 2025年 / 20卷 / 03期

关键词：

Digital electronic circuits; Electronic detector readout concepts (solid-state); VLSI circuits;

D O I：

10.1088/1748-0221/20/03/C03009

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Building on a prototype readout integrated circuit for segmented silicon sensors with the EDWARD event-driven readout architecture, the front-end in each pixel was replaced by a hardware generator to verify readout performance, ensuring no data loss, consistent priority handling, and speed verification. This generator produces Poisson-distributed readout requests with individually tunable rates per pixel via a digitally controlled oscillator. The resulting EDWARD65P1 test ASIC is a 32x32 pixel matrix with a 100 mu m pitch, equipped with digital event generators simulating radiation hits at user-defined rates. Test results for this new design are presented.

引用

页数：8