Optimal testing, patching, warranty, and pricing policies for smart products considering hardware-software interaction

被引:1
作者
Gao, Le [1 ]
Zhang, Zhaomin [2 ]
He, Shuguang [1 ]
He, Zhen [1 ]
机构
[1] Tianjin Univ, Coll Management & Econ, Tianjin 300072, Peoples R China
[2] Civil Aviat Univ China, Sch Transportat Sci & Engn, Tianjin 300300, Peoples R China
基金
中国国家自然科学基金;
关键词
Testing stop time; Warranty period optimization; Pricing; Software patch management; Hardware-software interaction; OPTIMAL RELEASE; COST; RELIABILITY; TIME; MODEL; OPTIMIZATION;
D O I
10.1016/j.cie.2025.110882
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
Early release of smart products followed by operational-phase updates through patches has become a common industry practice. However, a systematic examination of this approach remains limited in existing theoretical studies. This paper proposes an integrated framework of testing, patching, warranty, and pricing policies for smart products considering the hardware-software interaction. By modeling the various cost components and sales volume, we develop a profit optimization model that enables developers to identify the optimal combination of sales price, testing duration, warranty period, and number of patches to maximize total expected profit under reliability constraints. A comprehensive numerical study demonstrates the applicability and advantages of the proposed policy. The results show that the proposed policy is a win-win situation for both developer and consumers, not only maximizing the developer's total profit, but also enabling consumers to purchase more reliable products at lower prices.
引用
收藏
页数:13
相关论文
共 56 条
[11]  
Garg M., 2022, 2022 10 INT C REL IN, P1
[12]   OPTIMAL PRICE AND PROTECTION PERIOD DECISIONS FOR A PRODUCT UNDER WARRANTY [J].
GLICKMAN, TS ;
BERGER, PD .
MANAGEMENT SCIENCE, 1976, 22 (12) :1381-1390
[13]   TIME-DEPENDENT ERROR-DETECTION RATE MODEL FOR SOFTWARE RELIABILITY AND OTHER PERFORMANCE-MEASURES [J].
GOEL, AL ;
OKUMOTO, K .
IEEE TRANSACTIONS ON RELIABILITY, 1979, 28 (03) :206-211
[14]   Optimal release time for software systems considering cost, testing-effort, and test efficiency [J].
Huang, CY ;
Lyu, MR .
IEEE TRANSACTIONS ON RELIABILITY, 2005, 54 (04) :583-591
[15]   A software reliability growth model for imperfect debugging [J].
Huang, Yeu-Shiang ;
Chiu, Kuei-Chen ;
Chen, Wan-Ming .
JOURNAL OF SYSTEMS AND SOFTWARE, 2022, 188
[16]   Optimal testing resource allocation during module testing considering cost, testing effort and reliability [J].
Jha, P. C. ;
Gupta, Deepali ;
Yang, Bo ;
Kapur, P. K. .
COMPUTERS & INDUSTRIAL ENGINEERING, 2009, 57 (03) :1122-1130
[17]   Postrelease Testing and Software Release Policy for Enterprise-Level Systems [J].
Jiang, Zhengrui ;
Sarkar, Sumit ;
Jacob, Varghese S. .
INFORMATION SYSTEMS RESEARCH, 2012, 23 (03) :635-657
[18]   Optimal release and patching time of software with warranty [J].
Kansal Y. ;
Singh G. ;
Kumar U. ;
Kapur P.K. .
International Journal of System Assurance Engineering and Management, 2016, 7 (04) :462-468
[19]   Joint optimization of software time-to-market and testing duration using multi-attribute utility theory [J].
Kapur, P. K. ;
Panwar, Saurabh ;
Singh, Ompal ;
Kumar, Vivek .
ANNALS OF OPERATIONS RESEARCH, 2022, 312 (01) :305-332
[20]  
Kapur PK, 2014, INT J SYST ASSUR ENG, V5, P120, DOI 10.1007/s13198-014-0221-x