A Robust Design for Microwave Filters

被引：0

作者：

Zhang, Zhen ^{[1
,2
]}

Xu, Jifei ^{[4
]}

Yu, Yang ^{[3
]}

Zhang, Jianan ^{[2
]}

Yu, Ming ^{[5
]}

机构：

[1] Guangzhou Univ, Sch Elect & Commun Engn, Guangzhou, Peoples R China

[2] Southeast Univ, State Key Lab Millimeter Waves, Nanjing 210096, Peoples R China

[3] Chinese Acad Sci, Key Lab Microwave Remote Sensing, Natl Space Sci Ctr, Beijing 100190, Peoples R China

[4] Southern Univ Sci & Technol, Shenzhen Key Lab EM Informat, Shenzhen 518055, Peoples R China

[5] Southern Univ Sci & Technol, Dept Elect & Elect Engn, Shenzhen 518055, Peoples R China

来源：

IEEE MICROWAVE MAGAZINE | 2025年 / 26卷 / 02期

关键词：

SPACE-MAPPING OPTIMIZATION; RAPID YIELD ESTIMATION; POLYNOMIAL CHAOS; CIRCUIT OPTIMIZATION; EM OPTIMIZATION; REDUCTION; ALGORITHM; MODELS;

D O I：

10.1109/MMM.2024.3486598

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Microwave filters play an essential role in wireless communication systems. Manufacturing errors are inevitable during the fabrication of microwave filters, and reducing their impact on filter design is of crucial importance. This problem is typically defined as a yield optimization problem. Thus, the question emerges: How can the yield optimization algorithm enhance the robust design of microwave filters? This article will provide an answer to this question.

引用

页码：59 / 70

页数：12

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