Integrated High-Speed Wavelength Tracking on a Silicon Chip

被引：0

作者：

Elaskar, Javier ^{[1
]}

Cammarata, Simone ^{[1
,2
]}

Sama, Francesca ^{[1
]}

Di Pasquale, Fabrizio ^{[1
]}

Oton, Claudio J. ^{[1
]}

机构：

[1] Scuola Super Sant Anna, Inst Mech Intelligence, I-56124 Pisa, Italy

[2] Ist Nazl Fis Nucleare, Sez Pisa, I-56127 Pisa, Italy

来源：

JOURNAL OF LIGHTWAVE TECHNOLOGY | 2025年 / 43卷 / 07期

关键词：

Wavelength measurement; Optical attenuators; Phase modulation; Integrated optics; Optical resonators; Optical interferometry; Gratings; Frequency modulation; Stimulated emission; Optical variables measurement; Fiber Bragg grating; high-speed sensing; Mach-Zehnder modulator; Mach-Zehnder interferometer; photonic integrated circuits; silicon photonics; wavelength measurement; INTERROGATOR;

D O I：

10.1109/JLT.2024.3517736

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A compact wavelength tracking device is integrated into a silicon photonic chip. The device involves an unbalanced Mach-Zehnder interferometer equipped with high-speed PN junction phase shifters operating in carrier-depletion mode. The system uses a modulation-demodulation scheme for reliable wavelength shift extraction on the measured optical signal. The noise standard deviation is sigma = 0.17 pm, featuring a bandwidth of 150 kHz. Absolute wavelength measurements can be achieved within a 2 nm range. The device can also detect relative wavelength shifts in the 1520-1580 nm range. The proposed system finds applications in high-speed photonic sensing such as fast optical fiber Bragg grating sensor interrogation. Signal vibration detection at 42 kHz of a fiber Bragg grating sensor is also demonstrated.

引用

页码：3388 / 3396

页数：9