共 50 条
- [42] The Assembly Investigation of a Multichip to PCB Flip-Chip Package Using Cu Pillar Bumps IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2024, 14 (09): : 1661 - 1669
- [44] Current density dependence of EM (electromigration)-induced flip-chip Cu pad consumption 2006 INTERNATIONAL CONFERENCE ON ELECTRONIC MATERIALS AND PACKAGING, VOLS 1-3, 2006, : 991 - 1005
- [47] Temperature and current-density distributions in flip-chip solder joints with Cu traces Journal of Electronic Materials, 2006, 35 : 947 - 953
- [48] Simulation and reliability study of Cu/Low-k devices in flip-chip packages STRESS-INDUCED PHENOMENA IN METALLIZATION, 2004, 741 : 52 - 61
- [49] Study of electromigration-induced Cu consumption in the flip-chip SnCu solder bumps Journal of Applied Physics, 2006, 100 (08):