共 50 条
- [1] Effect of Soldering Sequences on Cu-Ni interaction in flip-chip interconnects 2018 19TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2018, : 1368 - 1371
- [2] Dielectric integrity test for flip-chip devices with Cu/low-k interconnects 55th Electronic Components & Technology Conference, Vols 1 and 2, 2005 Proceedings, 2005, : 1163 - 1171
- [3] 150-μm pitch Cu/Low-k flip chip packaging with polymer encapsulated dicing line (PEDL) and cu column interconnects IEEE TRANSACTIONS ON ADVANCED PACKAGING, 2008, 31 (01): : 58 - 65
- [4] Electromigration-induced failures at Cu/Sn/Cu flip-chip joint interfaces 2009 11TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE (EPTC 2009), 2009, : 401 - 405
- [6] Investigation of Cu stud bumping for single chip flip-chip assembly 54TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, VOLS 1 AND 2, PROCEEDINGS, 2004, : 1181 - 1186
- [8] Effect of silver content on the shear fatigue properties of Sn-Ag-Cu flip-chip interconnects Journal of Electronic Materials, 2004, 33 : 321 - 328