共 50 条
[42]
VERIFICATION OF NANOINDENTATION DEVICES USING ATOMIC FORCE MICROSCOPY
[J].
11TH INTERNATIONAL CONFERENCE ON NANOMATERIALS - RESEARCH & APPLICATION (NANOCON 2019),
2020,
:698-703
[50]
Nanoscale spatial mapping of mechanical properties through dynamic atomic force microscopy
[J].
BEILSTEIN JOURNAL OF NANOTECHNOLOGY,
2019, 10
:1332-1347