共 50 条
[21]
NANOSCALE CHARACTERIZATION OF POLYMER PRECURSOR DERIVED SILICON CARBIDE WITH ATOMIC FORCE MICROSCOPY AND NANOINDENTATION
[J].
PROCESSING AND PROPERTIES OF ADVANCED CERAMICS AND COMPOSITES II,
2010, 220
:257-268
[24]
Tip Bluntness Transition Measured with Atomic Force Microscopy and the Effect on Hardness Variation with Depth in Silicon Dioxide Nanoindentation
[J].
INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING,
2011, 12 (02)
:345-354