Molecular and Electronic Structures at Electrochemical Interfaces from In Situ Resonant X-Ray Diffraction

被引:0
|
作者
Soldo-Olivier, Yvonne [1 ]
Joly, Yves [1 ]
De Santis, Maurizio [1 ]
Grunder, Yvonne [2 ]
Blanc, Nils [1 ]
Sibert, Eric [3 ]
机构
[1] Univ Grenoble Alpes, Inst NEEL, CNRS, Grenoble INP, F-38000 Grenoble, France
[2] Univ Liverpool, Dept Phys, Oliver Lodge Lab, Liverpool L69 72E, England
[3] Univ Grenoble Alpes, Univ Savoie Mont Blanc, CNRS, Grenoble INP,LEPMI, F-38000 Grenoble, France
关键词
SURFACE; CHARGE;
D O I
10.1021/jacs.4c15282
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
An original approach to characterize electrochemical interfaces at the atomic level, a challenging topic toward the understanding of electrochemical reactivity, is reported. We employed in situ surface resonant X-ray diffraction experiments combined with their simulation using first-principle density functional theory calculations and were thus able to determine the molecular and electronic structures of the partially ionic layer facing the electrode surface, as well as the charge distribution in the surface metal layers. Pt(111) in an acidic medium at an applied potential excluding specific adsorption was studied. The presence of a positively charged counter layer composed of 1.60 water and 0.15 hydronium molecules per platinum surface unit cell at 2.8 & Aring; from the oppositely charged Pt(111) surface was found. Our results give a unique insight into the water-metal interaction at the electrochemical interfaces.
引用
收藏
页码:5106 / 5113
页数:8
相关论文
共 50 条
  • [31] Structures of underpotentially deposited HG on AU(111): An electrochemical and in-situ X-ray diffraction study.
    Li, J
    Abruna, HD
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1996, 211 : 128 - COLL
  • [32] Novel thick-layer electrochemical cell for in situ x-ray diffraction
    Scherb, G.
    Kazimirov, A.
    Zegenhagen, J.
    Review of Scientific Instruments, 1998, 69 (2 pt 1):
  • [33] A novel thick-layer electrochemical cell for in situ x-ray diffraction
    Scherb, G
    Kazimirov, A
    Zegenhagen, J
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (02): : 512 - 516
  • [34] Portable chamber for the study of UHV prepared electrochemical interfaces by hard x-ray diffraction
    Renner, Frank Uwe
    Gruender, Yvonne
    Zegenhagen, Joerg
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2007, 78 (03):
  • [35] Elastic properties determined from in situ X-ray diffraction
    Cervellino, A
    Derlet, PM
    Van Swygenhoven, H
    ACTA MATERIALIA, 2006, 54 (07) : 1851 - 1856
  • [36] X-Ray Probes for In Situ Studies of Interfaces
    Fong, D. D.
    Lucas, C. A.
    Richard, M. -I.
    Toney, M. F.
    MRS BULLETIN, 2010, 35 (07) : 504 - 513
  • [37] X-Ray Probes for In Situ Studies of Interfaces
    D. D. Fong
    C. A. Lucas
    M.-I. Richard
    M. F. Toney
    MRS Bulletin, 2010, 35 : 504 - 513
  • [38] In situ surface X-ray diffraction studies of electrochemical interfaces at a high-energy third-generation synchrotron facility
    Etgens, VH
    Alves, MCA
    Tadjeddine, A
    ELECTROCHIMICA ACTA, 1999, 45 (4-5) : 591 - 599
  • [39] Pyrochlore iridates: Electronic and magnetic structures, x-ray magnetic circular dichroism, and resonant inelastic x-ray scattering
    Antonov, V. N.
    Bekenov, L., V
    Kukusta, D. A.
    PHYSICAL REVIEW B, 2020, 102 (19)
  • [40] AMORPHOUS STRUCTURES STUDIED BY HIGH-ENERGY X-RAY DIFFRACTION AND RESONANT SCATTERING
    Schlenz, H.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2002, 58 : C48 - C48