Advanced Multipactor Testing With Enhanced Power Efficiency for Space Applications

被引:0
作者
Garcia-Patron, Martin [1 ]
Montero, Isabel [2 ]
Ruiz-Cruz, Jorge A. [3 ]
机构
[1] Natl Inst AerospaceTechnol INTA, Torrejon De Ardoz 28850, Madrid, Spain
[2] Consejo Super Invest Cient CS, Inst Ciencia Mat Madrid ICMM, Madrid 28049, Spain
[3] Univ Politecn Madrid UPM, Informat Proc & Telecommun Ctr IPTC, Madrid 28040, Spain
关键词
Radio frequency; Electrons; Testing; Discharges (electric); Electromagnetic waveguides; Surface treatment; Rectangular waveguides; Waveguide components; Three-dimensional displays; Surface discharges; Multipactor (MP); radio frequency (RF)/microwave high-power testing; resonant lines; secondary electron emission yield (SEY); space technology; surface treatment; test security margin; testbed; WAVE-GUIDE; BREAKDOWN; SUPPRESSION; GENERATION; PREDICTION; DISCHARGE; COATINGS;
D O I
10.1109/TIM.2024.3522680
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The multipactor (MP) effect is a discharge phenomenon that occurs in high-power microwave devices onboard spacecraft, and it can cause the breakdown of the transmission path. MP is also a serious problem in fields of great technological importance and its characterization is a key aspect in high-power radio frequency (RF)/microwave systems. This article introduces an advanced methodology for detecting MP, utilizing a novel testbed with loaded transmission lines. This method has the potential to significantly improve power efficiency in testing facilities, allowing for higher power levels in launching experiments. The results have shown an average gain of approximately 4.5 dB, both in continuous wave (CW) and pulsed operation. Compared to other traditional power enhancing setups, the novel testbed is both much less expensive and simpler to manufacture and operate, with the ability of working in large bandwidths and, also, under variable environmental conditions. This article includes the design of the testbed as well as the 3-D modeling of the device under test (DUT) with its rigorous experimental characterization. The simulated results of MP, based on the experimental secondary electron emission yield (SEY) of the microwave device, demonstrate good agreement with the MP threshold.
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页数:15
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