Composite Defect Detection Based on Digital Shearing Speckle Pattern Interferometry and Infrared Thermography

被引：0
作者：
Yan, Xushuai [1 ]
Li, Weixian [1 ]
Wu, Sijin [1 ]
机构：
[1] Beijing Informat Sci & Technol Univ, Sch Instrument Sci & Opto Elect Engn, Beijing 100192, Peoples R China
来源：
LASER & OPTOELECTRONICS PROGRESS | 2024年 / 61卷 / 24期
关键词：
nondestructive testing; digital shearing speckle pattern interferometry; infrared thermography; composite detection;
D O I：
10.3788/LOP240886
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Nondestructive testing technologies, each based on different principles, exhibit inherent limitations when used in isolation. The integration of multiple testing technologies can mitigate these limitations, offering a more robust and comprehensive defect detection process. This study proposes a composite defect detection method that integrates digital shearing speckle pattern interferometry with infrared thermography. A unified excitation source is utilized to harmonize the optical paths, enabling synchronized data acquisition from these two technologies. The synthesized results are then analyzed to identify defects. Experimental findings indicate that the proposed method effectively combines the strengths of the two technologies, resulting in excellent defect detection performance in real-world scenarios.
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页数：6
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