Single-shot X-ray imaging of two-dimensional strain fields in colloidal crystals

被引：0
|
作者：
Diao, Jiecheng [1 ]
Gao, Zichen [1 ]
Fan, Jiadong [1 ]
Tong, Yajun [1 ]
Ren, Hang [1 ]
Nie, Yonggan [1 ]
Robinson, Ian [2 ]
Jiang, Huaidong [1 ]
机构：
[1] ShanghaiTech Univ, Ctr Transformat Sci, Shanghai 201210, Peoples R China
[2] UCL, London Ctr Nanotechnol, London WC1E 6BT, England
来源：
IUCRJ | 2025年 / 12卷
基金：
中国国家自然科学基金; 英国工程与自然科学研究理事会;
关键词：
X-ray free electron lasers; XFELs; Bragg coherent diffraction imaging; BCDI; colloidal crystals; coherent X-ray diffractive imaging; CXDI; diffract-then-destroy; inorganic materials; PHASE RETRIEVAL; DYNAMICS;
D O I：
10.1107/S2052252524012521
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
We used a soft X-ray free-electron laser and the Bragg coherent diffraction imaging method to characterize the defect structure of colloidal crystals. The single-shot X-ray pulse allowed us to reach four powder rings and measured all six reflections of the hexagonal lattice. We reproduced the static shape of the 2D crystal and mapped out the 2D strain tensors inside the crystal. The observed defect structures agreed with electron microscope images of similar colloidal samples.
引用
收藏
页码：239 / 244
页数：6
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