Polarization-type potential-induced degradation in bifacial PERC modules in the field

被引:0
作者
Hacke, Peter [1 ]
Molto, Cecile [2 ]
Colvin, Dylan [2 ]
Smith, Ryan [3 ]
Mahmood, Farrukh Ibne [4 ]
Li, Fang [4 ]
Oh, Jaewon [5 ]
Tamizhmani, Govindasamy [4 ]
Seigneur, Hubert [2 ]
机构
[1] Natl Renewable Energy Lab, Golden, CO 80401 USA
[2] Univ Cent Florida, Florida Solar Energy Ctr, Cocoa, FL 32922 USA
[3] Pordis LLC, Austin, TX 78729 USA
[4] Arizona State Univ, Photovolta Reliabil Lab, Mesa, AZ 85212 USA
[5] Univ North Carolina Charlotte, Charlotte, NC 28223 USA
来源
EPJ PHOTOVOLTAICS | 2025年 / 16卷
关键词
Photovoltaics; photovoltaic modules; reliability; potential-induced degradation; SILICON MODULES;
D O I
10.1051/epjpv/2025004
中图分类号
O59 [应用物理学];
学科分类号
摘要
This study examines the susceptibility of bifacial glass/glass passivated emitter and rear cell (PERC) modules to potential-induced degradation-polarization (PID-p) in the field. While there are several studies showing PID-p occurring on both front and back faces of bifacial PERC in accelerated tests, we address the yet unclarified behavior in fielded modules. We examine the effects of mounting configuration; specifically, comparing modules mounted near ground and in elevated ground rack configurations. Modules with the cell circuit in -1500 V system voltage configuration, whether mounted on racks about 30 cm above the ground or elevated 2 m high showed mean degradation of 4.5% to 6% in power under standard test conditions over about 2.5 weeks as measured from the front side of the module. This extent of degradation remained sustained for a duration of about 6 months analyzed. Average daytime temperatures of modules in the various mounting configurations were similar and therefore judged to be insufficient to be a primary influence for the modest PID-p rate differences that we observed among mounting configurations. Increased leakage current in the morning suggests morning dew was sustained longer on modules near the ground measured over six months which would be expected to increase the PID-p rate over the long term. However, the main difference seen between the modules on the various mountings during the initial period with up to 6% mean degradation by PID-p was the approximately two times the irradiance from albedo on the rear of modules mounted in elevated ground rack compared to those on the near ground rack. This difference in incident albedo led to a modestly reduced rate of the development of PID-p of the modules on the elevated ground rack. The difference is attributed to the dissipation of PID-p-causing electrical charge by the albedo incident on the module rear. The behavior could be modeled by a sigmoidal equation with consideration of the differences in the insolation on the module rear.
引用
收藏
页数:12
相关论文
共 39 条
  • [1] Alduchov OA, 1996, J APPL METEOROL, V35, P601, DOI 10.1175/1520-0450(1996)035<0601:IMFAOS>2.0.CO
  • [2] 2
  • [3] [Anonymous], 2015, IEC 628041 Photovoltaic (PV) modules Test methods for the detection of potential-induced degradation Part 1: Crystalline silicon, IEC, Genvea
  • [4] Berghold J, 2014, 2014 IEEE 40TH PHOTOVOLTAIC SPECIALIST CONFERENCE (PVSC), P1987, DOI 10.1109/PVSC.2014.6925315
  • [5] Chadyiene R., 2008, J. Environ. Eng. Landscape Manag, P83
  • [6] Analysis of leakage currents in photovoltaic modules under high-voltage bias in the field
    del Cueto, JA
    McMahon, TJ
    [J]. PROGRESS IN PHOTOVOLTAICS, 2002, 10 (01): : 15 - 28
  • [7] Desharnais R., 2014, in 29th European Photovoltaic Solar Energy Conference and Exhibition
  • [8] Habersberger B.M., 2022, WCPEC-8 Milan, P939
  • [9] Impact of illumination and encapsulant resistivity on polarization-type potential-induced degradation on n-PERT cells
    Habersberger, Brian M.
    Hacke, Peter
    [J]. PROGRESS IN PHOTOVOLTAICS, 2022, 30 (05): : 455 - 463
  • [10] Habersberger BM, 2018, WORL CON PHOTOVOLT E, P3807, DOI 10.1109/PVSC.2018.8548117