Signal Integrity Analysis Between Continuous Vias and Indirect Vias on RDL Circuits

被引:0
|
作者
Ma, Yu-Zhi [1 ]
Wu, Sung-Mao [1 ]
机构
[1] Natl Univ Kaohsiung, Dept Elect Engn, Micro Elect Packaging Lab, Kaohsiung, Taiwan
关键词
Signal integrity; Continuous vias; Indirect vias; Redistribution Layer (RDL);
D O I
10.1109/IWEM59914.2024.10649180
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This study investigates the performance of continuous vias and indirect vias in Redistribution Layer (RDL) circuits. Through simulation and analysis using CST Studio Suite, a comparison is drawn regarding the signal integrity, impedance variation, and eye diagram characteristics of these two via designs. The findings reveal that continuous vias demonstrate superior signal integrity over long-distance transmission, while indirect vias exhibit more stable impedance characteristics. Additionally, the eye diagram analysis highlights that continuous vias display larger fluctuations compared to indirect vias, indicating greater waveform variability. These results lead to the conclusion that continuous vias are preferable for applications requiring strict timing or routing constraints, whereas indirect vias offer better overall performance. Understanding the trade-offs between these two via designs is crucial for optimizing RDL circuit designs to meet specific application requirements.
引用
收藏
页数:3
相关论文
共 33 条
  • [21] An Effective Approach for Thermal Performance Analysis of 3-D Integrated Circuits With Through-Silicon Vias
    Chai, Jingrui
    Dong, Gang
    Yang, Yintang
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2019, 9 (05): : 877 - 887
  • [22] Recurrent Neural Network (RNN) Based Signal Integrity Assessment for Coaxial-Through Glass Vias in Three-Dimensional Integration
    Sachdeva, Suyash
    Kiran, K. Madhu
    Chandel, Rajeevan
    Dhiman, Rohit
    8TH IEEE ELECTRON DEVICES TECHNOLOGY & MANUFACTURING CONFERENCE, EDTM 2024, 2024, : 319 - 321
  • [23] Analysis and Optimization of Sidewall Roughness on Microwave Performance of Through-Glass Vias in 3-D Integrated Circuits
    Fang, Zhen
    Zhang, Jihua
    Liu, Jinxu
    Chen, Hongwei
    Gao, Libin
    Yang, Xiaolin
    Li, Wenlei
    Cai, Xingzhou
    Guo, Huan
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2024, 72 (01) : 54 - 63
  • [24] Efficient Analysis for Multilayer Power-Ground Planes with Multiple Vias and Signal Traces in an Advanced Electronic Package
    Zaw, Zaw Oo
    Wei, Xing Chang
    Liu, En-Xiao
    Li, Er-Ping
    Li, Le-Wei
    2008 IEEE-EPEP ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING, 2008, : 85 - +
  • [25] Analysis of DC Current Crowding in Through-Silicon-Vias and Its Impact on Power Integrity in 3D ICs
    Zhao, Xin
    Scheuermann, Michael
    Lim, Sung Kyu
    2012 49TH ACM/EDAC/IEEE DESIGN AUTOMATION CONFERENCE (DAC), 2012, : 157 - 162
  • [26] Novel co-simulation method for analysis of power integrity and EMI in electronic packages with large number of power/ground vias
    Oo, Zaw Zaw
    Liu Enxiao
    Wei Xing Chang
    Li Erpirig
    Chua Eng Kee
    Li Le-Wei
    2007 9TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, VOLS 1 AND 2, 2007, : 421 - +
  • [27] An Efficient Hybrid Boundary-Integral and Finite-Element Method for Signal Integrity Analysis of Multiple Vias Sharing an Anti-Pad in an Infinitely-Large Plate Pair
    Zhang, Yao-Jiang
    Tian, Xinxin
    Ren, Liehui
    Liu, Dazhao
    Fan, Jun
    2014 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC), 2014, : 224 - 229
  • [28] Crosstalk analysis between non-parallel coupled lines connected with vias in a 4-layer PCB
    Han, Jae Kwon
    Park, Dong Chul
    CEEM' 2006: ASIA-PACIFIC CONFERENCE ON ENVIRONMENTAL ELECTROMAGNETICS, VOLS 1 AND 2, PROCEEDINGS, 2006, : 728 - +
  • [29] Numerical analysis of thermo-mechanical reliability of through silicon vias (TSVs) and solder interconnects in 3-dimensional integrated circuits
    Ladani, Leila J.
    MICROELECTRONIC ENGINEERING, 2010, 87 (02) : 208 - 215
  • [30] Signal Integrity Analysis of Integrated Circuits by Using Embedded Domain Decomposition Method
    Lu, Jiaqing
    Lee, Jin-Fa
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2018, 66 (12) : 5369 - 5382