Signal Integrity Analysis Between Continuous Vias and Indirect Vias on RDL Circuits

被引:0
|
作者
Ma, Yu-Zhi [1 ]
Wu, Sung-Mao [1 ]
机构
[1] Natl Univ Kaohsiung, Dept Elect Engn, Micro Elect Packaging Lab, Kaohsiung, Taiwan
关键词
Signal integrity; Continuous vias; Indirect vias; Redistribution Layer (RDL);
D O I
10.1109/IWEM59914.2024.10649180
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This study investigates the performance of continuous vias and indirect vias in Redistribution Layer (RDL) circuits. Through simulation and analysis using CST Studio Suite, a comparison is drawn regarding the signal integrity, impedance variation, and eye diagram characteristics of these two via designs. The findings reveal that continuous vias demonstrate superior signal integrity over long-distance transmission, while indirect vias exhibit more stable impedance characteristics. Additionally, the eye diagram analysis highlights that continuous vias display larger fluctuations compared to indirect vias, indicating greater waveform variability. These results lead to the conclusion that continuous vias are preferable for applications requiring strict timing or routing constraints, whereas indirect vias offer better overall performance. Understanding the trade-offs between these two via designs is crucial for optimizing RDL circuit designs to meet specific application requirements.
引用
收藏
页数:3
相关论文
共 33 条
  • [1] Build-Up Spiral and GND Vias for Improving Signal Integrity of Signal Core Vias
    Kung, Ming-Lung
    Lin, Liang-Yu
    Lin, Ken-Huang
    Cheng, Hung-Hsiang
    Tien, Yun-Hsiang
    Ding, Yi-Chuan
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2021, 11 (11): : 2031 - 2034
  • [2] Failure Analysis of Faulty vias or Contacts in Mixed-Signal Integrated Circuits
    Wu, Chunlei
    IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2018, 18 (04) : 568 - 573
  • [3] Performance analysis of signal vias using virtual islands with shorting vias in multilayer PCBs
    Nam, S
    Kim, Y
    Kim, Y
    Jang, H
    Hur, S
    Song, B
    Lee, J
    Jeong, J
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2006, 54 (04) : 1315 - 1324
  • [4] Signal Integrity Analysis of High-Speed Single-Ended and Differential Vias
    Shen, Zuwei
    Tong, Jian
    EPTC: 2008 10TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, VOLS 1-3, 2008, : 65 - +
  • [5] A Hybrid Method for Signal Integrity Analysis of Traces and Vias in an Infinitely Large Plate Pair
    Ren, Liehui
    Shao, Peng
    Qiu, Kelvin
    Lim, Jane
    Brooks, Rick
    Tian, Xinxin
    Zhang, Yaojiang
    Fan, Jun
    IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 2015, 57 (04) : 885 - 893
  • [6] MODELING AND ANALYSIS OF VIAS IN MULTILAYERED INTEGRATED-CIRCUITS
    GU, QZ
    YANG, YE
    TASSOUDJI, MA
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1993, 41 (02) : 206 - 214
  • [7] Signal Integrity Analysis of Package and Printed Circuit Board With Multiple Vias in Substrate of Layered Dielectrics
    Wu, Boping
    Tsang, Leung
    IEEE TRANSACTIONS ON ADVANCED PACKAGING, 2010, 33 (02): : 510 - 516
  • [8] Experimental Characterization and Signal Integrity Verification of Interconnect Lines with Inter-layer Vias
    Kim, Hyewon
    Kim, Dongchul
    Eo, Yungseon
    JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, 2011, 11 (01) : 15 - 22
  • [9] Hybrid analysis for electromagnetic characteristics of through vias in microwave multilayer circuits
    Tian, Yu
    Tong, Ling
    Li, Hai-Liang
    Dianzi Keji Daxue Xuebao/Journal of the University of Electronic Science and Technology of China, 2012, 41 (03): : 392 - 396
  • [10] COUPLED NOISE-ANALYSIS FOR ADJACENT VIAS IN MULTILAYERED DIGITAL CIRCUITS
    GU, QZ
    TASSOUDJI, MA
    POH, SY
    SHIN, RT
    KONG, JA
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-FUNDAMENTAL THEORY AND APPLICATIONS, 1994, 41 (12): : 796 - 804