Reliability Estimation and Failure Analysis of LEDs with Various Currents and Correlated Color Temperatures for Identical Power Ratings: A Comparative Study

被引:0
作者
Lokesh, J. [1 ]
Kini, S. G. [1 ]
Padmasali, A. N. [1 ]
Mahesha, M. G. [2 ]
机构
[1] Manipal Inst Technol, Manipal Acad Higher Educ, Dept Elect & Elect Engn, Manipal 576104, Karnataka, India
[2] Manipal Inst Technol, Manipal Acad Higher Educ, Dept Phys, Manipal 576104, Karnataka, India
关键词
DEGRADATION PHYSICS; PHOSPHOR; CAPACITANCE; MECHANISMS; STRESS; ORIGIN; DIODES;
D O I
10.1021/acsomega.5c00588
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
LEDs are available in a variety of correlated color temperatures (CCTs) to suit specific application needs. Manufacturers also offer LEDs with varying power ranges, and identical power ratings but different voltage and current specifications. While consumers prioritize power ratings and CCT, the lack of reliability information in manufacturer specifications makes LED selection challenging. A comprehensive lifetime performance and reliability analysis is crucial to address this gap, aiding consumers in selecting suitable LEDs for luminaire design and helping manufacturers identify failure causes through physics of failure analysis. This study evaluates the reliability analysis of 3.84 W phosphor converted high-power LEDs with various CCTs (warm white and cool white) and with varying voltage/current rating parameters for the same power through accelerated testing in an environmental chamber. The SPD, photoluminescence, capacitance-voltage (C-V), and current-voltage (I-V) measurements are used to conduct additional physics of failure analysis. The analysis showed that WW LEDs decay faster in lumen performance compared to CW LEDs and chip degradation is the primary cause for the reduced light output in both WW and CW LEDs. Among the different specifications for the same power rating in WW and CW LEDs, the lumen performance is observed to be almost similar. But there is comparable difference in Duv in CW LEDs.
引用
收藏
页码:8756 / 8766
页数:11
相关论文
共 37 条
[1]   Effect of thermal stress and short-wavelength visible radiation on phosphor-embedded LED encapsulant degradation [J].
Appaiah, Prathika ;
Narendran, Nadarajah ;
Perera, Indika U. ;
Zhu, Yiting ;
Liu, Yi-Wei .
OPTICAL MATERIALS, 2015, 46 :6-11
[2]   Deep traps and temperature effects on the capacitance of p-type Si-doped GaAs Schottky diodes on (211) and (311) oriented GaAs substrates [J].
Boumaraf, R. ;
Sengouga, N. ;
Mari, R. H. ;
Meftah, Af. ;
Aziz, M. ;
Jameel, Dler ;
Al Saqri, Noor ;
Taylor, D. ;
Henini, M. .
SUPERLATTICES AND MICROSTRUCTURES, 2014, 65 :319-331
[3]   Long-term degradation mechanisms of mid-power LEDs for lighting applications [J].
Buffolo, M. ;
De Santi, C. ;
Meneghini, M. ;
Rigon, D. ;
Meneghesso, G. ;
Zanoni, E. .
MICROELECTRONICS RELIABILITY, 2015, 55 (9-10) :1754-1758
[4]   Study of High-Brightness LED Samples Aged Under Stress Temperature Conditions: Electrical Characterizations and Signature Evolution Analysis [J].
Canale, Laurent ;
Dupuis, Pascal ;
Leng, Sovannarith ;
Zissis, Georges .
IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS, 2016, 52 (01) :502-510
[5]  
Cao HC, 2016, 2016 13TH CHINA INTERNATIONAL FORUM ON SOLID STATE LIGHTING (SSLCHINA 2016), P74, DOI 10.1109/SSLCHINA.2016.7804355
[6]  
Davis J. Lynn, 2017, 2017 18 INT C THERM
[7]   Physics-of-Failure-Based Prognostics and Health Management for High-Power White Light-Emitting Diode Lighting [J].
Fan, Jiajie ;
Yung, K. C. ;
Pecht, Michael .
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2011, 11 (03) :407-416
[8]   Dynamics Studies of Nitrogen Interstitial in GaN from Ab Initio Calculations [J].
He, Huan ;
Liu, Wenbo ;
Zhang, Pengbo ;
Liao, Wenlong ;
Tong, Dayin ;
Yang, Lin ;
He, Chaohui ;
Zang, Hang ;
Zong, Hongxiang .
MATERIALS, 2020, 13 (16)
[9]   Optimization of tellurite glass system toward enhanced luminescence of phosphor solids for white LEDs [J].
Hua, Youjie ;
Sun, Jun ;
Ma, Hongping ;
Ye, Renguang ;
Huang, Feifei ;
Xu, Shiqing .
OPTICAL MATERIALS, 2021, 119 (119)
[10]   Degradation Mechanism Decoupling of Mid-Power White-Light LEDs by SPD Simulation [J].
Huang, Jianlin ;
Golubovic, Dusan S. ;
Koh, Sau ;
Yang, Daoguo ;
Li, Xiupeng ;
Fan, Xuejun ;
Zhang, Guoqi .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016, 63 (07) :2807-2814