共 22 条
[1]
JIA D W,, REN Y F,, LI L M,, Et al., Research on optimization of hybrid energy storage capacity using ensemble empirical mode decomposition and fuzzy control [J], Acta energiae solaris sinica, 44, 2, pp. 239-246, (2023)
[2]
FANG S D, WANG H D, ZHANG S X,, Et al., Optimal management of shipboard energy storage system considering battery lifetime degradation[J], Proceedings of the CSEE, 40, 23, pp. 7566-7578, (2020)
[3]
LI C R,, XIAO F, FAN Y X,, Et al., Joint estimation of the state of charge and the state of health based on deep learning for lithium-ion batteries[J], Proceedings of the CSEE, 41, 2, pp. 681-692, (2021)
[4]
WANG Y J,, ZUO X., Review on estimation methods for state of charge of lithium-ion battery and their application scenarios[J], Automation of electric power systems, 46, 14, pp. 193-207, (2022)
[5]
HE B C, YANG X M, WANG J S, Et al., Prediction of remaining useful life of lithium-ion batteries based on PCA-GPR[J], Acta energiae solaris sinica, 43, 5, pp. 484-491, (2022)
[6]
GUHA A,, PATRA A., Online estimation of the electrochemical impedance spectrum and remaining useful life of lithium-ion batteries[J], IEEE transactions on instrumentation and measurement, 67, 8, pp. 1836-1849, (2018)
[7]
KHODADADI SADABADI K,, JIN X,, RIZZONI G., Prediction of remaining useful life for a composite electrode lithium ion battery cell using an electrochemical model to estimate the state of health[J], Journal of power sources, 481, (2021)
[8]
LIU Q Q, ZHANG J Y,, LI K, Et al., The remaining useful life prediction by using electrochemical model in the particle filter framework for lithium-ion batteries[J], IEEE access, 8, pp. 126661-126670, (2020)
[9]
LONG B, XIAN W M, JIANG L, Et al., An improved autoregressive model by particle swarm optimization for prognostics of lithium-ion batteries[J], Microelectronics reliability, 53, 6, pp. 821-831, (2013)
[10]
ZHOU Y P,, HUANG M H., Lithium-ion batteries remaining useful life prediction based on a mixture of empirical mode decomposition and ARIMA model[J], Microelectronics reliability, 65, pp. 265-273, (2016)