Electrical Stress on Semiconductor Devices Mounted on PCB during Electrostatic Elimination by Corona Discharge Ionizer

被引：0

作者：

Nakano, Aguri ^{[1
]}

Okano, Makoto ^{[2
]}

Terashige, Takashi ^{[3
]}

机构：

[1] Okinawa Polytech Coll, Prod Elect Informat Syst Technol, 2994-2 Ikehara, Okinawa, Okinawa 9042141, Japan

[2] Oyo Elect Co Ltd, Dev Grp, 100-29 Yoshitomi,Shisui Machi, Kikuchi, Kumamoto 8611201, Japan

[3] Hiroshima Int Univ, Dept Hlth & Wellness Sci, 5-1-1 Hiroko Shinkai, Kure, Hiroshima 7370112, Japan

来源：

IEEJ TRANSACTIONS ON ELECTRICAL AND ELECTRONIC ENGINEERING | 2024年

关键词：

semiconductor device; electrostatic hazard; electrical stress; air ionizer; static elimination;

D O I：

10.1002/tee.24245

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Semiconductor devices mounted on printed circuit boards may be damaged by electrical stresses based on induced voltages due to the electric field generated by corona discharge ionizers during the static elimination, because the input line connected to the semiconductor device acts as an antenna terminating the electric field. An electrical stress sensor using an operational amplifier with an input line was mounted on a printed circuit board, in order to investigate the input line length dependence of the electrical stress due to the electric field by the ionizer. The results showed that recent scaled-down semiconductor devices may be damaged when the length of the input line exceeds 50 mm during static elimination with the corona discharge ionizer. (c) 2024 Institute of Electrical Engineers of Japan and Wiley Periodicals LLC.

引用

页数：3

共 49 条

[1] A SONIC JET CORONA IONIZER FOR ELECTROSTATIC DISCHARGE AND AEROSOL NEUTRALIZATION
ROMAY, FJ
LIU, BYH
PUI, DYH
AEROSOL SCIENCE AND TECHNOLOGY, 1994, 20 (01) : 31 - 41
[2] CORONA DISCHARGE - ELECTROSTATIC METHOD FOR DEPOSITION OF POWDERED PASSIVATION GLASS ON SEMICONDUCTOR-DEVICES
COMIZZOLI, RB
IEEE TRANSACTIONS ON PARTS HYBRIDS AND PACKAGING, 1977, 13 (03): : 322 - 328
[3] A Study on Electrical Stress Induced by Electrostatic Discharge on Wearable Devices
Yoshida, Takahiro
2015 7TH ASIA-PACIFIC CONFERENCE ON ENVIRONMENTAL ELECTROMAGNETICS (CEEM), 2015, : 230 - 233
[4] Electrostatic discharge in semiconductor devices: An overview
Vinson, JE
Liou, JJ
PROCEEDINGS OF THE IEEE, 1998, 86 (02) : 399 - 418
[5] Prolog to electrostatic discharge in semiconductor devices: An overview
Esch, J
PROCEEDINGS OF THE IEEE, 1998, 86 (02) : 397 - 398
[6] Electrostatic discharge in semiconductor devices: Protection techniques
Vinson, JE
Liou, JJ
PROCEEDINGS OF THE IEEE, 2000, 88 (12) : 1878 - 1900
[7] A Study on Long Duration Electrical Stress Induced by Electrostatic Discharge on Wearable Devices
Yoshida, Takahiro
2016 ASIA-PACIFIC INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (APEMC), 2016, : 445 - 447
[8] Design and Evaluation of a High Concentration, High Penetration Unipolar Corona Ionizer for Electrostatic Discharge and Aerosol Charging
Intra, Panich
Tippayawong, Nakorn
JOURNAL OF ELECTRICAL ENGINEERING & TECHNOLOGY, 2013, 8 (05) : 1175 - 1181
[9] Effect of electrostatic discharge on semiconductor devices and subsequent annealing of electrostatic defects
M. I. Gorlov
I. V. Vorontsov
A. V. Andreev
Measurement Techniques, 1998, 41 : 65 - 67
[10] Effect of electrostatic discharge on semiconductor devices and subsequent annealing of electrostatic defects
Gorlov, MI
Vorontsov, IV
Andreev, AV
MEASUREMENT TECHNIQUES, 1998, 41 (01) : 65 - 67

← 1 2 3 4 5 →