Operational Amplifier Circuits for Magnetic Sensing Using Perpendicular Low-Coercivity Nanoscale Spin Transfer Torque Magnetic Tunnel Junctions

被引:0
作者
Nicolas, Hugo [1 ]
Sousa, Ricardo C. [2 ]
Mora-Hernandez, Ariam [2 ]
Prejbeanu, Ioan-Lucian [2 ]
Hebrard, Luc [3 ]
Kammerer, Jean-Baptiste [3 ]
Pascal, Joris [1 ]
机构
[1] Univ Appl Sci & Arts Northwestern Switzerland, Sch Life Sci HLS, CH-4132 Muttenz, Switzerland
[2] French Alternat Energies & Atom Energy Commiss CEA, Spintec Lab, F-38000 Grenoble, France
[3] Univ Strasbourg, ICube Lab, F-67000 Strasbourg, France
基金
欧洲研究理事会;
关键词
Sensors; Magnetic tunneling; Magnetic sensors; Magnetic field measurement; Circuits; Voltage measurement; Junctions; Probes; Noise; Nanoscale devices; Low coercivity; magnetic sensor; magnetic tunnel junction; nanometer scale; signal processing electronics; spin transfer torque; spin transfer torque magnetic tunnel junction (STT-MTJ); SENSOR;
D O I
10.1109/JSEN.2025.3537700
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This article presents the use of nanoscale perpendicular spin transfer torque magnetic tunnel junctions (STT-MTJs) as magnetic sensing units in which the conditioning electronics consists of simple circuits based on operational amplifier (OpAmp). This approach allows low-power ( mu W), nanoscale (50-100 nm), and high-frequency (100-1000 kHz) magnetic measurements, with, in addition, presenting CMOS compatibility for future mass production. Noise levels as low as 2 mu T/ Hz are achieved over a dynamic range of up to tens of milliteslas. The different circuits are demonstrated through theoretical modeling and confirmed with experimental measurements on fabricated devices, validating the working principle with sensing elements among the smallest ever reported to our knowledge. Further improvements are, however, required, in both the proposed electronics and stacks of the junctions, to lower the noise and reach the sub-microtesla noise level. Hence, this technology could open the way to new metrological possibilities, unaddressed with existing technologies, including photolithographic mask alignment or high-frequency current measurements, in the case of industrial applications, as well as measurements of magnetic beads and ferromagnetic particle detection in life sciences.
引用
收藏
页码:9550 / 9559
页数:10
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