FaceLift: Semi-supervised 3D Facial Landmark Localization

被引:2
作者
Ferman, David [1 ]
Garrido, Pablo [1 ]
Bharaj, Gaurav [1 ]
机构
[1] Flawless AI, London, England
来源
2024 IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION, CVPR 2024 | 2024年
关键词
D O I
10.1109/CVPR52733.2024.00175
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
3D facial landmark localization has proven to be of particular use for applications, such as face tracking, 3D face modeling, and image-based 3D face reconstruction. In the supervised learning case, such methods usually rely on 3D landmark datasets derived from 3DMM-based registration that often lack spatial definition alignment, as compared with that chosen by hand-labeled human consensus, e.g., how are eyebrow landmarks defined? This creates a gap between landmark datasets generated via high-quality 2D human labels and 3DMMs, and it ultimately limits their effectiveness. To address this issue, we introduce a novel semi- supervised learning approach that learns 3D landmarks by directly lifting (visible) hand-labeled 2D landmarks and ensures better definition alignment, without the need for 3D landmark datasets. To lift 2D landmarks to 3D, we leverage 3D-aware GANs for better multi-view consistency learning and in-the-wild multi-frame videos for robust cross-generalization. Empirical experiments demonstrate that our method not only achieves better definition alignment between 2D- 3D landmarks but also outperforms other supervised learning 3D landmark localization methods on both 3DMM labeled and photogrammetric ground truth evaluation datasets. Project Page: https://davidcferman.github.io/FaceLift
引用
收藏
页码:1781 / 1791
页数:11
相关论文
共 62 条
[61]  
Zhu Xiangyu., 2017, IEEE Transactions on Pattern Analysis and Machine Intelligence, V41, P78, DOI [DOI 10.1109/TPAMI.2017.2778152, DOI 10.1109/TBDATA.2017.2736547, 10.1109/MGRS.2017.2762307]
[62]   State of the Art on Monocular 3D Face Reconstruction, Tracking, and Applications [J].
Zollhoefer, M. ;
Thies, J. ;
Garrido, P. ;
Bradley, D. ;
Beeler, T. ;
Perez, P. ;
Stamminger, M. ;
Niessner, M. ;
Theobalt, C. .
COMPUTER GRAPHICS FORUM, 2018, 37 (02) :523-550