On the split Voigt profile and its use in the analysis of X-ray diffraction patterns

被引：0

作者：

Sanchez-Bajo, F. ^{[1
]}

机构：

[1] Univ Extremadura, Escuela Ingn Ind, Dept Fis Aplicada, Avda Elvas S-N, Badajoz 06006, Spain

来源：

REVISTA MEXICANA DE FISICA | 2025年 / 71卷 / 02期

关键词：

X-ray diffraction; split Voigt function; line-broadening; CRYSTALLITE-SIZE; FOURIER-ANALYSIS; LATTICE-STRAIN; REFINEMENT;

D O I：

10.31349/RevMexFis.71.021004

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The main properties (integral breadth, FWHM, Fourier transform) of the split Voigt function have been analysed. These are important in study of the X-ray diffraction peaks. In this way, some X-ray diffraction lines of a sample of quartz and zirconia have been analysed by using single line methods, describing the instrumental-spectral asymmetric peaks by means of split Voigt functions.

引用

页码：1 / 14

页数：14

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