Non-destructive measurement of the charge transfer across LaMnO3/SrTiO3 interfaces

被引:0
作者
Miyagawa, Shohei [1 ]
Ishii, Yuta [2 ]
Anada, Masato [1 ,3 ]
Nagai, Kazuki [1 ,3 ]
Kitamura, Miho [4 ]
Kumigashira, Hiroshi [5 ]
Wakabayashi, Yusuke [1 ]
机构
[1] Tohoku Univ, Grad Sch Sci, Dept Phys, Sendai 9808578, Japan
[2] Natl Inst Mat Sci, Ctr Basic Res Mat CBRM, 1-2-1 Sengen, Tsukuba, Ibaraki 3050003, Japan
[3] Osaka Univ, Grad Sch Engn Sci, Div Mat Phys, Toyonaka 5608531, Japan
[4] Natl Inst Quantum Sci & Technol QST, Sendai 9808579, Japan
[5] Tohoku Univ, Inst Multidisciplinary Res Adv Mat, Sendai 9808577, Japan
基金
日本学术振兴会;
关键词
X-RAY-SCATTERING; TRANSITION; FILMS; FERROMAGNETISM; PHYSICS; EDGE;
D O I
10.1063/5.0258175
中图分类号
O59 [应用物理学];
学科分类号
摘要
Local polarization and charge transfer at the interface between 7-unit cell-thick LaMnO3 (LMO) ultrathin films and substrates composed of Nb-doped (0.05 wt. %) and undoped SrTiO3 (STO) are examined by resonant surface x-ray diffraction. Notably, this photon-in photon-out technique allows us to simultaneously examine the valence distribution and local polarization with minimal radiation damage. Consistent with previous reports, Mn2+ is observed at the interface. Furthermore, the degree of charge transfer is nearly unchanged by the 0.05 wt. % of Nb doping. In the middle of the LMO films, the valence of Mn is 3+. Local polarization estimated from the cation/anion displacements shows that the electric field points outward in the LMO films, and polarization is suppressed in the STO substrate region.
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页数:7
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