A Metrology System for Large Deployable Space Structures Using Optical Frequency Domain Reflectometry

被引：0

作者：

Passe, Heather ^{[1
]}

Medina, Kamron ^{[1
]}

Crotser, Dave ^{[2
]}

Peterson, Lee D. ^{[3
]}

Kominsky, Dan ^{[4
]}

机构：

[1] Redwire Space, Longmont, CO 80503 USA

[2] Unaffiliated, Longmont, CO 80503 USA

[3] Safira Pin LLC, Placitas, NM 87043 USA

[4] Luna Innovat, Optic Syst Grp, Blacksburg, VA 24060 USA

来源：

AIAA SCITECH 2024 FORUM | 2024年

关键词：

D O I：

暂无

中图分类号：

V [航空、航天];

学科分类号：

08 ; 0825 ;

摘要：

A microns-accurate, touchless metrology system characterizes large structures to high resolution in real-time to meet the rising demand for increasingly large space-based structures. This system can measure absolute position and vibration of an oscillating structure with a bandwidth of up to 1Hz. It has been demonstrated on a deployable prototype which is representative in size and stiffness of a flight structure of interest. Algorithm development and validation activities have brought a high level of maturity to the free-space reflectometry architecture concept, enabling persistent, non-invasive characterization of engineered structures in space.

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页数：18

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