A Metrology System for Large Deployable Space Structures Using Optical Frequency Domain Reflectometry

A microns-accurate, touchless metrology system characterizes large structures to high resolution in real-time to meet the rising demand for increasingly large space-based structures. This system can measure absolute position and vibration of an oscillating structure with a bandwidth of up to 1Hz. It has been demonstrated on a deployable prototype which is representative in size and stiffness of a flight structure of interest. Algorithm development and validation activities have brought a high level of maturity to the free-space reflectometry architecture concept, enabling persistent, non-invasive characterization of engineered structures in space.