A Study of Different Annealing Ambiences on the Performance of ZnGa2O4 UVC Photodetectors by Ultrasonic Spray Pyrolysis Deposition

被引:0
作者
Shih, Shun-Cheng [1 ]
Guo, Chung-Yu [1 ]
Liu, Han-Yin [2 ]
Ko, Rong-Ming [3 ]
Hsu, Wei-Chou [1 ]
机构
[1] Natl Cheng Kung Univ, Inst Microelect, Tainan 701, Taiwan
[2] Natl Sun Yat sen Univ, Dept Elect Engn, Kaohsiung 804, Taiwan
[3] Natl Cheng Kung Univ, Acad Innovat Semicond & Sustainable Mfg, Tainan 701, Taiwan
关键词
Annealing; Photonic band gap; Photodetectors; Substrates; Optical films; Optical sensors; Optical diffraction; Fingers; Acoustics; Temperature measurement; Metal-semiconductor-metal (MSM); ultrasonic spray pyrolysis deposition (USPD); UVC photodetector; wide bandgap; ZnGa2O4; ULTRAVIOLET PHOTODETECTORS; EPITAXIAL-GROWTH; THIN-FILM;
D O I
10.1109/JSEN.2024.3432136
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This study presents ZnGa2O4 thin films, which are prepared on c-plane sapphire by ultrasonic spray pyrolysis deposition (USPD) and postdeposition annealing techniques. The postannealing process was carried out at a temperature of 800 degrees C in various ambiences, such as oxygen, nitrogen, and air. A systematic analysis was conducted on the material properties, such as crystalline quality and optical performance of ZnGa2O4 thin films after annealing. The material analyses indicate that the crystallinity, surface roughness, oxygen vacancy, and energy bandgap of the ZnGa2O4 were significantly improved through annealing. The ZnGa2O4 photodetector annealed at air shows the largest photo/dark current ratio of similar to 10(6) and a high maximum responsivity of 24.7 A/W at a wavelength of 240 nm and bias of 5 V. These results suggest the potential of spinel ZnGa2O4 thin films in the applications of UVC detection.
引用
收藏
页码:6242 / 6249
页数:8
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