Identification and Localization Study of Grounding System Defects in Cross-Bonded Cables

被引:0
作者
Zhang, Qiying [1 ]
Li, Kunsheng [2 ]
Chen, Lian [1 ]
Luo, Jian [3 ]
Zhao, Zhongyong [1 ]
机构
[1] Southwest Univ, Coll Engn & Technol, Chongqing 400716, Peoples R China
[2] State Grid Chongqing Elect Power Co, Ultra High Voltage Branch, Chongqing 400716, Peoples R China
[3] Chongqing Univ, Coll Elect Engn, Chongqing 400716, Peoples R China
关键词
cross-bonded cables; distribution parameter modelling; grounding system defects; PSO-SVM algorithm; defect identification and localization; sheath voltage and current characteristics; FAULT LOCATION METHOD; PARTIAL DISCHARGE; UNDERGROUND CABLE; POWER-CABLES; XLPE CABLE; SHEATH; CIRCUIT;
D O I
10.3390/electronics14030622
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Cross-bonded cables improve transmission efficiency by optimizing the grounding method. However, due to the complexity of their grounding system, they are prone to multiple types of defects, making defect state identification more challenging. Additionally, accurately locating sheath damage defects becomes more difficult in cases of high transition resistance. To address these issues, this paper constructs a distributed parameter circuit model for cross-bonded cables and proposes a particle swarm optimization support vector machine (PSO-SVM) defect classification model based on the sheath voltage and current phase angle and amplitude characteristics. This model effectively classifies 25 types of grounding system states. Furthermore, for two types of defects-open joints and sheath damage short circuits-this paper proposes an accurate segment-based location method based on fault impedance characteristics, using zero-crossing problems to achieve efficient localization. The results show that the distributed parameter circuit model for cross-bonded cables is feasible for simulating electrical quantities, as confirmed by both simulation and real-world applications. The defect classification model achieves an accuracy of over 97%. Under low transition resistance, the defect localization accuracy exceeds 95.4%, and the localization performance is significantly improved under high transition resistance. Additionally, the defect localization method is more sensitive to variations in cable segment length and grounding resistance impedance but less affected by fluctuations in core voltage and current.
引用
收藏
页数:23
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