Intensified electric field based highly sensitive backbone-shaped C and X band microwave metamaterial sensor for permittivity characterization applications

This paper proposed a novel design of planar microwave sensor aimed at distinguishing and analyzing the permittivity properties of regular solid materials with high sensitivity for C and X band applications. These sensor utilize a planar backbone-shaped metamaterial resonator with spur line filters, which intensify the electric field. This approach allows the permittivity characteristics of the resonator to influence factors like resonance frequency shifting and notably high sensitivity, reaching 6.61 % at reflection mode. The sensitivity of these sensor is validated using common materials (Rogers 4350B, Rogers RT5880, UL1250 and FR-4) through the specific experimental methodology. The measured results agree well with the simulated results, and this validation process permits the potential characterization and detection of materials. Furthermore, the paper derives a mathematical formula to obtain the properties of materials using resonance frequency shifting. Consequently, proposed sensor represent a promising solution for characterizing material permittivity properties.