THz scanning near-field microscopy of HgTe nanocrystals

被引：0

作者：

Santos, Cristiane N. ^{[1
]}

Lhuillier, Emmanuel ^{[2
]}

Lebouvier, Edouard ^{[3
]}

Wallter, Benjamin ^{[3
]}

Faucher, Marc ^{[1
]}

Lampin, Jean-Francois ^{[1
]}

机构：

[1] Univ Lille, UMR 8520, CNRS, IEMN, Ave Poincare, F-59652 Villeneuve Dascq, France

[2] Sorbonne Univ, CNRS, UMR 7588, INSP, 4 Pl Jussieu, F-75005 Paris, France

[3] Vmicro SAS, Ave Poincare, F-59652 Villeneuve Dascq, France

来源：

2024 49TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES, IRMMW-THZ 2024 | 2024年

关键词：

Scanning near-field optical microscopy; terahertz; mercury telluride; nanocrystals; molecular laser;

D O I：

10.1109/IRMMW-THz60956.2024.10697628

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Far-field terahertz imaging is limited by diffraction to resolutions in the tens of micrometers range. On the other hand, near-field optical microscopy is a technique that shows permittivity contrasts at the nanoscale. We present here images of HgTe nanocrystals grown by chemical synthesis in liquid phase. The images are obtained by scattering scanning near-field microscopy at 2.52 THz and show a high contrast compared to the silicon substrate.

引用

页数：2

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