New online beam intensity synchronous monitoring system in scanning transmission X-ray microscopy

被引：0

作者：

Jiao, Yuchen ^{[1
,2
]}

Zhang, Xiangzhi ^{[1
,2
,3
]}

Xu, Zijian ^{[1
,2
,3
]}

Yao, Zhen ^{[3
,4
]}

Sun, Tianxiao ^{[5
]}

Zhang, Yufei ^{[3
,4
]}

Zhao, Bo ^{[3
]}

Guo, Zhi ^{[1
,2
,3
]}

Wang, Yong ^{[1
,2
,3
]}

Zhen, Xiangjun ^{[1
,2
,3
]}

Liu, Haigang ^{[1
,2
,3
]}

Liang, Shasha ^{[3
,4
]}

Li, Haitao ^{[3
]}

Zhao, Xuanyu ^{[3
,4
]}

He, Jian ^{[3
]}

Tai, Renzhong ^{[1
,2
,3
,4
]}

机构：

[1] Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai 201800, Peoples R China

[2] Univ Chinese Acad Sci, Shanghai 100049, Peoples R China

[3] Chinese Acad Sci, Shanghai Adv Res Inst, Shanghai Synchrotron Radiat Facil, Shanghai 201204, Peoples R China

[4] Shanghaitech Univ, Shanghai 201210, Peoples R China

[5] Univ Texas Austin, Austin, TX 78712 USA

来源：

JOURNAL OF SYNCHROTRON RADIATION | 2025年 / 32卷

基金：

中国国家自然科学基金;

关键词：

STXM; high-speed beam intensity monitoring; top-up mode; noise removal; POSITION; DIAMOND;

D O I：

10.1107/S1600577524012141

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The scanning transmission X-ray microscopy (STXM) platform based on synchrotron radiation has achieved nanoscale imaging with chemical sensitivity using spectro-microscopy techniques. However, the quality of STXM imaging is affected by the stability of the beam intensity. The top-up operation mode of synchrotrons to maintain a constant electron beam intensity introduces periodic fluctuations in the X-ray beam intensity, leading to notable imaging noise that decreases both contrast and precision. To address this issue, a high-speed real-time beam intensity monitoring system was designed and implemented at the BL08U1A beamline of the Shanghai Synchrotron Radiation Facility. This system utilizes an yttrium-aluminium-garnet crystal along with dual detectors having an acquisition frequency of up to 1 MHz and a synchronization error of less than 20 ns between them. This system can precisely and synchronously monitor the X-ray beam intensity variations which are used to remove noise due to electron injection from STXM images, thereby markedly improving the quality of STXM imaging.

引用

页码：424 / 431

页数：8

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