Applications of Cd(Zn)Te Radiation Detectors in Non-Destructive Testing and Evaluation

被引:0
作者
Whittemore, Anthony R. [1 ]
Zannoni, Elena Maria [1 ]
机构
[1] Univ Texas Austin, Walker Dept Mech Engn, Austin, TX 78712 USA
关键词
semiconductor radiation detectors; X-ray and gamma-ray detectors; compound semiconductor radiation detectors; high-Z semiconductor radiation detectors; non-destructive testing; NDT; GAMMA-RAY SPECTROSCOPY; COMPUTED-TOMOGRAPHY; SPATIAL-RESOLUTION; ENERGY RESOLUTION; X-RAYS; CDZNTE; SEMICONDUCTOR; CDTE; PERFORMANCE; PHOTON;
D O I
10.3390/s25061776
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
This review explores the applications of room temperature semiconductor detectors, with a focus on Cd(Zn)Te based detection systems, in non-destructive testing and evaluation (NDT&E). Cd(Zn)Te detectors, which operate efficiently at ambient temperatures, eliminate the need for cryogenic cooling systems and offer high energy and spatial resolution, making them ideal for a wide range of NDT&E applications. Key performance parameters such as energy resolution, spatial resolution, time resolution, detector efficiency, and form factor are discussed. The paper highlights the utilization of Cd(Zn)Te detectors in various imaging and spectroscopic applications, including nuclear threat detection and non-proliferation, archaeological NDT, and Unmanned Aerial Vehicle radiological surveying. Cd(Zn)Te detectors hold significant promise in NDT&E due to their high-resolution imaging, superior spectroscopic capabilities, versatility, and portability.
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页数:28
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