A Programmable Gate Driver Module-Based Multistage Voltage Regulation SiC MOSFET Switching Strategy

被引:0
|
作者
Tan, Jixiang [1 ]
Zhou, Zhongfu [1 ]
Zou, Gongjie [2 ]
机构
[1] Swansea Univ, Fac Sci & Engn, Dept Elect & Elect Engn, Bay Campus, Swansea SA1 8EN, Wales
[2] Chongqing Design Grp, 183 He Xiao Rd, Chongqing 401100, Peoples R China
关键词
grid driver circuit control; silicon carbide MOSFET; double-pulse test circuit; voltage and current overshoot; LTspice;
D O I
10.3390/electronics13224379
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Silicon carbide (SiC) metal-oxide semiconductor field-effect transistors (MOSFETs), as a new material, have the advantages of low drain-source resistance, high thermal conductivity, low leakage current, and high switching frequency compared with silicon (Si)-based MOSFETs. Therefore, in many industrial applications, Si MOSFETs have been replaced by SiC MOSFETs. However, as the switching speed increases exponentially, some problems are amplified, the most serious of which is the overshoot of current and voltage. The increase in voltage and current slope caused by high switching speeds inevitably leads to overshoot, oscillations, and additional losses in the circuit. This paper focusses on the actual performance of the optimised switching strategy (OSS) in circuit testing and combines the existing simulation results to verify the practicability of OSS. In this paper, the optimised switching strategy is introduced first, and then, the LTspice model of SiC MOSFET is established in detail and verifies the feasibility of the OSS through half-bridge circuit simulation. Finally, the test platform is built using a programmable gate drive module (2ASC-12A1HP). Through a 400 V/30 A double-pulse test, the practicality of the OSS is verified. The experiments show that the OSS can greatly improve the switching performance of SiC MOSFETs.
引用
收藏
页数:12
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