Development and testing of a dual-frequency real-time hardware feedback system for the hard X-ray nanoprobe beamline of the SSRF

被引:0
作者
Jiang, Zhisen [1 ]
Jiang, Hui [1 ,2 ]
He, Yinghua [1 ]
He, Yan [1 ]
Liang, Dongxu [1 ]
Yu, Huaina [1 ]
Li, Aiguo [1 ,2 ]
Signorato, Riccardo [3 ]
机构
[1] Chinese Acad Sci, Shanghai Synchrotron Radiat Facil, Shanghai Adv Res Inst, 239 Zhangheng Rd, Shanghai 201204, Peoples R China
[2] Chinese Acad Sci, Shanghai Inst Appl Phys, 2019 Jialuo Rd, Shanghai 201800, Peoples R China
[3] SRI Tech, Viale Lavoro 42A, I-35010 Vigonza, Italy
基金
上海市自然科学基金; 中国国家自然科学基金;
关键词
X-ray; feedback; PID; FPGA; frequency domain; FLUX;
D O I
10.1107/S1600577524010208
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A novel dual-frequency real-time feedback system has been developed to simultaneously optimize and stabilize beam position and energy at the hard X-ray nanoprobe beamline of the Shanghai Synchrotron Radiation Facility. A user-selected cut-off frequency is used to separate the beam position signal obtained from an X-ray beam position monitor into two parts, i.e. high-frequency and low-frequency components. They can be real-time corrected and optimized by two different optical components, one chromatic and the other achromatic, of very different inertial mass, such as Bragg monochromator dispersive elements and a pre-focusing total external reflection mirror. The experimental results shown in this article demonstrate a significant improvement in position and energy stabilities. The long-term beam angular stability clearly improved from 2.21 to 0.92 mu rad RMS in the horizontal direction and from 0.72 to 0.10 mu rad RMS in the vertical direction.
引用
收藏
页码:100 / 108
页数:9
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