Fundamental Aspects of Semiconductor Device Modeling Associated With Discrete Impurities: Nonequilibrium Green's Function Scheme

被引:1
|
作者
Sano, Nobuyuki [1 ]
机构
[1] Univ Tsukuba, Inst Appl Phys, Tsukuba, Ibaraki 3058573, Japan
关键词
Impurities; Electric potential; Scattering; Poisson equations; Green's function methods; Wires; Substrates; Electrons; Fluctuations; Semiconductor device modeling; Coulomb interaction; device simulation; discrete impurity; impurity scattering; nonequilibrium Green's function (NEGF); random dopant fluctuation; DRIFT-DIFFUSION SIMULATIONS; DOPANT; VARIABILITY; TRANSPORT;
D O I
10.1109/TED.2024.3499940
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A new theoretical framework for the nonequilibrium Green's function (NEGF) scheme is presented to account for the discrete nature of impurities doped in semiconductors. Since the impurity potential is singular, the short-range screened impurity potential is included as the self-energy due to spatially localized impurity scattering. The long-range part of the impurity potential is treated as the self-consistent Hartree potential. The present framework is applied to cylindrical wires under the quasi-one-dimensional (quasi-1D) approximation. We show explicitly how the discrete nature of impurities affects transport properties such as electrostatic potential, local density of states (LDOSs), carrier density, and scattering rates. Furthermore, we demonstrate that the present scheme allows for the quantitative analysis of variabilities in transport characteristics of nanoscale thin wires.
引用
收藏
页码:24 / 30
页数:7
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