The promise of GaAs 200 in small-angle neutron scattering for higher resolution

被引:0
|
作者
Magerl, A. [1 ,2 ]
Lemmel, H. [3 ,4 ]
Appel, M. [4 ]
Weisser, M. [5 ]
Kretzer, U. [6 ]
Zobel, M. [2 ,7 ]
机构
[1] Friedrich Alexander Univ Erlangen Nurnberg, Dept Phys, Biophys Grp, Henkestr 91, D-91052 Erlangen, Germany
[2] Forschungszentrum Julich GmbH, JCNS 3 Neutron Analyt Energy Res, Wilhelm Johnen Str, D-52428 Julich, Germany
[3] TU Wien, Atominst, Stadionallee 2, A-1020 Vienna, Austria
[4] Inst Laue Langevin, 71 Ave Martyrs, F-38000 Grenoble, France
[5] Friedrich Alexander Univ Erlangen Nurnberg, Dept Phys, Crystallog & Struct Phys, Staudtstr 3, D-91058 Erlangen, Germany
[6] Freiberger Compound Mat GmbH, Junger Lowe Schacht 5, D-09599 Freiberg, Germany
[7] Rhein Westfal TH Aachen, Inst Crystallog, Jagerstr 17-19, D-52066 Aachen, Germany
来源
关键词
ultra-small-angle neutron diffraction; USANS; Bonse-Hart diffractometer; GaAs; 200; CRYSTALS;
D O I
10.1107/S1600576724007246
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The Q resolution in Bonse-Hart double-crystal diffractometers is determined for a given Bragg angle by the value of the crystallographic structure factor. To date, the reflections Si 220 or Si 111 have been used exclusively in neutron scattering, which provide resolutions for triple-bounce crystals of about 2 x 10(-5) angstrom(-1) (FWHM). The Darwin width of the GaAs 200 reflection is about a factor of 10 smaller, offering the possibility of a Q resolution of 2 x 10(-6) angstrom(-1) provided crystals of sufficient quality are available. This article reports a feasibility study with single-bounce GaAs 200, yielding a Q resolution of 4.6 x 10(-6) angstrom(-1), six times superior in comparison with a Si 220 setup.
引用
收藏
页码:1282 / 1287
页数:6
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