Toward TSV-Compatible Microfluidic Cooling for 3D ICs

被引:0
|
作者
Yan, Geyu [1 ]
Chung, Euichul [1 ]
Masselink, Erik [1 ]
Oh, Shane [1 ]
Zia, Muneeb [1 ]
Ramakrishnan, Bharath [2 ]
Oruganti, Vaidehi [2 ]
Alissa, Husam [2 ]
Belady, Christian [3 ]
Im, Yunhyeok [4 ]
Joshi, Yogendra
Bakir, Muhannad S. [1 ]
机构
[1] Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30318 USA
[2] Microsoft CO I, Redmond, WA 98052 USA
[3] Vantage Data Ctr, Denver, CO 80206 USA
[4] Georgia Inst Technol, George W Woodruff Sch Mech Engn, Atlanta, GA 30318 USA
基金
美国国家科学基金会;
关键词
Through-silicon vias; Three-dimensional displays; Cooling; Copper; Microfluidics; Resistance heating; Heat sinks; Fabrication; Silicon; Power dissipation; 3-D integrated circuit (3D IC); data center efficiency; microfluidic cooling; micropin-fin; through-silicon via (TSV); THROUGH-SILICON-VIAS; FIN HEAT SINK; PIN; TECHNOLOGY;
D O I
10.1109/TCPMT.2024.3516653
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Cooling presents a significant challenge for high-performance three-dimensional integrated circuits (3D ICs). To this end, this research explores through-silicon via (TSV)-compatible micropin-fin heat sink (MPFHS) for high-power 3D chip stacks. Copper TSVs with a diameter of 5.2 mu m and a high aspect ratio of 29:1 are developed. An extensive experimental and computational investigation of the MPFHS under varying flow rates and power conditions was conducted, showing that the MPFHS maintains an average chip temperature below 72 degrees C, even with a total power dissipation of 500 W and a power density of 312 W/cm (2) at a flow rate of 117 mL/min. The minimum total thermal resistance achieved was 0.286 degrees C<middle dot>cm (2) /W.
引用
收藏
页码:104 / 112
页数:9
相关论文
共 50 条
  • [41] A novel efficient TSV built-in test for stacked 3D ICs
    Guibane, Badi
    Hamdi, Belgacem
    Bensalem, Brahim
    Mtibaa, Abdellatif
    TURKISH JOURNAL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCES, 2018, 26 (04) : 1909 - 1921
  • [42] On Accurate Full-Chip Extraction and Optimization of TSV-to-TSV Coupling Elements in 3D ICs
    Peng, Yarui
    Song, Taigon
    Petranovic, Dusan
    Lim, Sung Kyu
    2013 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD), 2013, : 281 - 288
  • [43] Effectiveness of thermal redistribution layer in cooling of 3D ICs
    Wang, Fengjuan
    Li, Yue
    Yu, Ningmei
    Yang, Yuan
    INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS, 2021, 34 (03)
  • [44] Efficient Region-aware P/G TSV Planning for 3D ICs
    Yao, Song
    Chen, Xiaoming
    Wang, Yu
    Ma, Yuchun
    Xie, Yuan
    Yang, Huazhong
    PROCEEDINGS OF THE FIFTEENTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN (ISQED 2014), 2015, : 171 - +
  • [45] TSV-aware Interconnect Length and Power Prediction for 3D Stacked ICs
    Kim, Dae Hyun
    Mukhopadhyay, Saibal
    Lim, Sung Kyu
    PROCEEDINGS OF THE 2009 IEEE INTERNATIONAL INTERCONNECT TECHNOLOGY CONFERENCE, 2009, : 26 - 28
  • [46] Defect Clustering-Aware Spare-TSV Allocation for 3D ICs
    Wang, Shengcheng
    Tahoori, Mehdi B.
    Chakrabarty, Krishnendu
    2015 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD), 2015, : 307 - 314
  • [47] Electrical Characterization of RF TSV for 3D Multi-Core and Heterogeneous ICs
    Le, Yu
    Yang, Haigang
    Jing, Tom T.
    Xu, Min
    Geer, Robert
    Wang, Wei
    2010 IEEE AND ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD), 2010, : 686 - 693
  • [48] A cost-effective repair scheme for clustered TSV defects in 3D ICs
    Maity, Dilip Kumar
    Roy, Surajit Kumar
    Giri, Chandan
    MICROELECTRONICS RELIABILITY, 2022, 129
  • [49] Trend from ICs to 3D ICs to 3D Systems
    Tummala, Rao R.
    Sundaram, Venky
    Chatterjee, Ritwik
    Raj, P. Markondeya
    Kumbhat, Nitesh
    Sukumaran, Vijay
    Sridharan, Vivek
    Choudury, Abhishek
    Chen, Qiao
    Bandyopadhyay, Tapobrata
    PROCEEDINGS OF THE IEEE 2009 CUSTOM INTEGRATED CIRCUITS CONFERENCE, 2009, : 439 - 444
  • [50] 3-D Stacked Tier-Specific Microfluidic Cooling for Heterogeneous 3-D ICs
    Zhang, Yue
    Zheng, Li
    Bakir, Muhannad S.
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2013, 3 (11): : 1811 - 1819