Micron-scale imaging using bulk ultrasonics

被引：1

作者：

Chandran, Loheshwaran ^{[1
]}

Syed Akbar Ali, Mohamed Subair ^{[1
]}

Bobbs, Bradley ^{[3
]}

Dutta, Chandan ^{[1
]}

Joseph, J. D. ^{[2
]}

Bhattacharya, Enakshi ^{[2
]}

Rajagopal, Prabhu ^{[1
,2
]}

机构：

[1] Indian Inst Technol Madras, Ctr Nondestruct Evaluat CNDE, Chennai 600036, Tamil Nadu, India

[2] Indian Inst Technol Madras, Ctr NEMS & Nanophoton CNNP, Chennai 600036, Tamil Nadu, India

[3] Intelligent Opt Syst Inc, 19601 Mariner Ave, Torrance, CA 90503 USA

来源：

SCIENTIFIC REPORTS | 2024年 / 14卷 / 01期

关键词：

Sub-wavelength imaging; Micro metamaterial; Periodic holey structures; Rayleigh diffraction limitation; Acoustic microscopy;

D O I：

10.1038/s41598-024-72634-2

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

An extraordinary resolution down to 50 microns is demonstrated for the first time for bulk ultrasonics, using novel micro-fabricated metamaterial lenses. The development and performance of the silicon-based Fabry-Perot type metalenses with an array of 10 micrometre square holes are discussed. Challenges in wave reception are addressed by a custom-developed micro-focal laser with a sub-micron spot size and an innovative experimental set-up together with physics based signal processing. The results provide a pathway for material diagnostics at greater depths with high resolution using micro-metalens-enhanced ultrasound as an alternative to expensive and radiation prone electromagnetic techniques.

引用

页数：20

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