X-ray Multilens Interferometer based on Silicon Refractive Lenses for Diagnostic of the Coherent Properties of Radiation

被引：0

作者：

D. Zverev ^{[1
]}

M. Sorokovikov ^{[1
]}

V. Yunkin ^{[2
]}

S. Kuznetsov ^{[2
]}

A. Snigirev ^{[1
]}

机构：

[1] Immanuel Kant Baltic Federal University, Kaliningrad

[2] Institute of Microelectronics Technology RAS, Chernogolovka

来源：

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques | 2024年 / 18卷 / Suppl 1期

基金：

俄罗斯科学基金会;

关键词：

coherence; compound refractive lenses; interferometer; source diagnostics; synchrotron; X-ray optics;

D O I：

10.1134/S1027451024701854

中图分类号：

学科分类号：

摘要：

We are proposing an experimental demonstration of the change in the degree of coherence of X‑ray radiation scattered within a volume of high dispersion, weakly absorbing material—termed a decoherer. A multilens interferometer based on silicon planar compound refractive lenses is used as a diagnostic tool. The experiment was conducted at the ID13B beamline of the ESRF synchrotron radiation source (Grenoble, France) at an X-ray energy of 12.4 keV. The gradual increase in the thickness of the decoherer allowed for the observation of the degradation of the interference fringes formed by the interferometer. © Pleiades Publishing, Ltd. 2024.

引用

页码：S45 / S50

页数：5

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