X-ray Multilens Interferometer based on Silicon Refractive Lenses for Diagnostic of the Coherent Properties of Radiation

被引：0
作者：
D. Zverev [1 ]
M. Sorokovikov [1 ]
V. Yunkin [2 ]
S. Kuznetsov [2 ]
A. Snigirev [1 ]
机构：
[1] Immanuel Kant Baltic Federal University, Kaliningrad
[2] Institute of Microelectronics Technology RAS, Chernogolovka
来源：
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques | 2024年 / 18卷 / Suppl 1期
基金：
俄罗斯科学基金会;
关键词：
coherence; compound refractive lenses; interferometer; source diagnostics; synchrotron; X-ray optics;
D O I：
10.1134/S1027451024701854
中图分类号：
学科分类号：
摘要：
We are proposing an experimental demonstration of the change in the degree of coherence of X‑ray radiation scattered within a volume of high dispersion, weakly absorbing material—termed a decoherer. A multilens interferometer based on silicon planar compound refractive lenses is used as a diagnostic tool. The experiment was conducted at the ID13B beamline of the ESRF synchrotron radiation source (Grenoble, France) at an X-ray energy of 12.4 keV. The gradual increase in the thickness of the decoherer allowed for the observation of the degradation of the interference fringes formed by the interferometer. © Pleiades Publishing, Ltd. 2024.
引用
收藏
页码：S45 / S50
页数：5
相关论文
共 50 条
  • [31] Performance of Multilayer Monochromators for Hard X-Ray Imaging with Coherent Synchrotron Radiation
    Dietsch, R.
    Rack, A.
    Weitkamp, T.
    Riotte, M.
    Rack, T.
    Holz, T.
    Kraemer, M.
    Weissbach, D.
    Morawe, Ch.
    Siewert, F.
    Meduna, M.
    Cloetens, P.
    Ziegler, E.
    10TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY, 2011, 1365 : 77 - 80
  • [32] X-Ray Interferometer Based on Fresnel Zone Plates
    Haroutiunyan, L. A.
    Trouni, K. G.
    Hovhannisyan, G. M.
    JOURNAL OF CONTEMPORARY PHYSICS-ARMENIAN ACADEMY OF SCIENCES, 2011, 46 (01) : 34 - 36
  • [33] X-ray interferometer based on fresnel zone plates
    L. A. Haroutiunyan
    K. G. Trouni
    G. M. Hovhannisyan
    Journal of Contemporary Physics (Armenian Academy of Sciences), 2011, 46 : 34 - 36
  • [34] Refractive X-Ray Lenses Made by the Two-Photon Laser Lithography Method
    A. D. Patolyatov
    D. A. Shcherbakov
    D. A. Kolymagin
    R. P. Matital
    D. A. Chubich
    A. G. Vitukhovsky
    Physics of Wave Phenomena, 2022, 30 : 325 - 329
  • [35] Refractive X-Ray Lenses Made by the Two-Photon Laser Lithography Method
    Patolyatov, A. D.
    Shcherbakov, D. A.
    Kolymagin, D. A.
    Matital, R. P.
    Chubich, D. A.
    Vitukhovsky, A. G.
    PHYSICS OF WAVE PHENOMENA, 2022, 30 (05) : 325 - 329
  • [36] Theoretical and experimental results of focusing performance for the parabolic compound X-ray refractive lenses
    Le Zi-Chun
    Dong Wen
    Liu Wei
    Zhang Ming
    Liang Jing-Qiu
    Quan Bi-Sheng
    Liu Kai
    Liang Zhong-Zhu
    Zhu Pei-Ping
    Yi Fu-Ting
    Huang Wan-Xia
    ACTA PHYSICA SINICA, 2010, 59 (03) : 1977 - 1984
  • [37] Feasibility Analysis of Sapphire Compound Refractive Lenses for Advanced X-Ray Light Sources
    Wang, Yunzhu
    Dong, Xiaohao
    Hu, Jun
    FRONTIERS IN PHYSICS, 2022, 10
  • [38] X-ray diffraction microscopy based on refractive optics
    Roth, T.
    Detlefs, C.
    Snigireva, I.
    Snigirev, A.
    OPTICS COMMUNICATIONS, 2015, 340 : 33 - 38
  • [39] X-Ray Nanointerferometer Based on Si Refractive Bilenses
    Snigirev, A.
    Snigireva, I.
    Kohn, V.
    Yunkin, V.
    Kuznetsov, S.
    Grigoriev, M. B.
    Roth, T.
    Vaughan, G.
    Detlefs, C.
    PHYSICAL REVIEW LETTERS, 2009, 103 (06)
  • [40] Projection-type X-ray microscope based on a spherical compound refractive X-ray lens
    Dudchik, Yu. I.
    Gary, C. K.
    Park, H.
    Pantell, R. H.
    Piestrup, M. A.
    ADVANCES IN X-RAY/EUV OPTICS AND COMPONENTS II, 2007, 6705
12345