X-ray Multilens Interferometer based on Silicon Refractive Lenses for Diagnostic of the Coherent Properties of Radiation

被引：0
作者：
D. Zverev [1 ]
M. Sorokovikov [1 ]
V. Yunkin [2 ]
S. Kuznetsov [2 ]
A. Snigirev [1 ]
机构：
[1] Immanuel Kant Baltic Federal University, Kaliningrad
[2] Institute of Microelectronics Technology RAS, Chernogolovka
来源：
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques | 2024年 / 18卷 / Suppl 1期
基金：
俄罗斯科学基金会;
关键词：
coherence; compound refractive lenses; interferometer; source diagnostics; synchrotron; X-ray optics;
D O I：
10.1134/S1027451024701854
中图分类号：
学科分类号：
摘要：
We are proposing an experimental demonstration of the change in the degree of coherence of X‑ray radiation scattered within a volume of high dispersion, weakly absorbing material—termed a decoherer. A multilens interferometer based on silicon planar compound refractive lenses is used as a diagnostic tool. The experiment was conducted at the ID13B beamline of the ESRF synchrotron radiation source (Grenoble, France) at an X-ray energy of 12.4 keV. The gradual increase in the thickness of the decoherer allowed for the observation of the degradation of the interference fringes formed by the interferometer. © Pleiades Publishing, Ltd. 2024.
引用
收藏
页码：S45 / S50
页数：5
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