A computational study of AlScN-based ferroelectric tunnel junction

被引:0
|
作者
Yang, Ning [1 ]
Cheng, Guoting [1 ]
Guo, Jing [1 ]
机构
[1] Univ Florida, Dept Elect & Comp Engn, Gainesville, FL 32611 USA
基金
美国国家科学基金会;
关键词
Ferroelectric; Memory device; Tunnel junction;
D O I
10.1016/j.sse.2024.109026
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Ferroelectric (FE) AlScN materials have been experimentally explored for memory and neuromorphic computing device applications. Here a computational study is performed to simulate the device characteristics and assess the performance potential of a ferroelectric tunnel junction (FTJ) based on AlScN. We parameterize an efficient k & sdot;p Hamiltonian from the complex band structure of AlScN from ab initio density-functional theory calculations to enable efficient quantum transport simulations of the FTJ device. Using a metal-FE-graphene structure enhances the barrier height modulation and the tunneling electroresistance (TER) ratio, compared to a metal-FE-semiconductor FTJ device structure. The barrier height modulation between ON and OFF states can reach similar to 0.7eV with a FE polarization of 25 mu C/cm 2 . Reducing the AlScN tunnel layer thickness is important for increasing the device ON current and reducing the read latency. The results indicate the importance of contact designs and FE layer thickness in the design of AlScN-based FTJ devices, and highlight the potential of AlScN FTJ for future memory device technology applications.
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页数:7
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