4D X-Ray Tomography with Millisecond Temporal Resolution

被引:0
|
作者
Yashiro, Wataru
机构
来源
Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering | 2024年 / 90卷 / 12期
关键词
Compendex;
D O I
10.2493/jjspe.90.896
中图分类号
学科分类号
摘要
引用
收藏
页码:896 / 900
相关论文
共 50 条
  • [1] Developments in X-Ray Tomography XIV
    Müller, Bert
    Wang, Ge
    Proceedings of SPIE - The International Society for Optical Engineering, 2022, 12242
  • [2] HIGH RESOLUTION X-RAY TECHNIQUES.
    Lal, Krishnan
    Indian Journal of Pure and Applied Physics, 1981, 19 (09): : 854 - 862
  • [3] Contrast enhancement in X-ray phase contrast tomography
    1600, Optical Society of America (OSA) (22):
  • [4] Recent progress of X-ray tomography in material science field
    Kobayashi, Masakazu
    Toda, Hiroyuki
    Uesugi, Kentaro
    Takeuchi, Akihisa
    Suzuki, Yoshio
    Keikinzoku/Journal of Japan Institute of Light Metals, 2014, 64 (11): : 510 - 517
  • [5] Reconstruction of 2D x-ray radiographs at the National Ignition Facility using pinhole tomography
    Field, J. E.
    Rygg, J. R.
    Barrios, M. A.
    Benedetti, L. R.
    Doeppner, T.
    Izumi, N.
    Jones, O.
    Khan, S. F.
    Ma, T.
    Nagel, S. R.
    Pak, A.
    Tommasini, R.
    Bradley, D. K.
    Town, R. P. J.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2014, 85 (11):
  • [6] THE COMPLEMENTARY USE OF 3D X-RAY MICRO-COMPUTED TOMOGRAPHY WITH TRADITIONAL METALLOGRAPHY
    Kar, Nikhil
    Bovie, Adam
    Roig, Tim
    Advanced Materials and Processes, 2022, 180 (01): : 16 - 20
  • [7] MULTIWIRE X-RAY COUNTER WITH HIGH ENERGY RESOLUTION.
    KARABADZHAK, G.F.
    PESKOV, V.D.
    1981, V 24 (N 6 PT 2): : 1520 - 1522
  • [8] Effect of object thickness on resolution of X-ray TDI detectors
    Dimalanta, Anthony
    e-Journal of Nondestructive Testing, 2023, 28 (08):
  • [9] HIGH-RESOLUTION X-RAY-SCATTERING MEASUREMENTS FOR THE ADVANCED X-RAY ASTROPHYSICS FACILITY (AXAF)
    ZOMBECK, MV
    WYMAN, CC
    WEISSKOPF, MC
    OPTICAL ENGINEERING, 1982, 21 (01) : 63 - 72
  • [10] A machine learning supported sinogram interpolation method for X-ray computed tomography
    Bellens, Simon
    Janssens, Michel
    Vandewalle, Patrick
    Dewulf, Wim
    e-Journal of Nondestructive Testing, 2023, 28 (03):