Near-isotropic sub-Ångstrom 3d resolution phase contrast imaging achieved by end-to-end ptychographic electron tomography

被引:4
作者
You, Shengbo [1 ,2 ]
Romanov, Andrey [1 ,2 ]
Pelz, Philipp M. [1 ,2 ]
机构
[1] Friedrich Alexander Univ Erlangen Nurnberg, IZNF, Inst Microand Nanostruct Res IMN, D-91058 Erlangen, Germany
[2] Friedrich Alexander Univ Erlangen Nurnberg, IZNF, Ctr Nanoanal & Electron Microscopy CENEM, D-91058 Erlangen, Germany
关键词
ptychography; joint reconstruction; electron tomography; electron microscopy; inverse problems; 4D-STEM; DUAL-AXIS TOMOGRAPHY; ATOMS; RECONSTRUCTION; DIFFRACTION; MICROSCOPY; ALGORITHM;
D O I
10.1088/1402-4896/ad9a1a
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Three-dimensional atomic resolution imaging using transmission electron microscopes is a unique capability that requires challenging experiments. Linear electron tomography methods are limited by the missing wedge effect, requiring a high tilt range. Multislice ptychography can achieve deep sub-& Aring;ngstrom resolution in the transverse direction, but depth resolution is limited to 2 to 3 nanometers. In this paper, we propose and demonstrate an end-to-end approach to reconstructing the electrostatic potential volume of the sample directly from the 4D-STEM datasets. End-to-end multislice ptychographic tomography recovers several slices at each tomography tilt angle and compensates for the missing wedge effect. The algorithm is initially tested in simulation with a Pt@Al2O3 core-shell nanoparticle, where both heavy and light atoms are recovered in 3D from an unaligned 4D-STEM tilt series with a restricted tilt range of 90 degrees. We also demonstrate the algorithm experimentally, recovering a Te nanoparticle with sub-& Aring;ngstrom resolution.
引用
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页数:13
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